Post-breakdown conduction mechanism of thin oxide films and their aspects

2003 ◽  
Vol 86 (3) ◽  
pp. 21-27
Author(s):  
Kenji Komiya ◽  
Takashi Oka ◽  
Naoki Okada ◽  
Yasuhisa Omura





1989 ◽  
pp. 303-310
Author(s):  
T. Paul Adl ◽  
H. F. Stehmeyer




2007 ◽  
Vol 19 (24) ◽  
pp. NA-NA
Author(s):  
M. Takahashi ◽  
T. Maeda ◽  
K. Uemura ◽  
J. Yao ◽  
Y. Tokuda ◽  
...  




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