Thickness Measurement and Control in the Manufacture of Polyethylene Cable Sheath

1954 ◽  
Vol 33 (3) ◽  
pp. 559-577
Author(s):  
W. T. Eppler
Keyword(s):  
Thickness Measurement ◽  
And Control ◽  
Measurement And Control

Surface Contamination Measurement and Control by Nondestructive Techniques

1985 ◽  
Vol 28 (6) ◽  
pp. 30-32
Author(s):  
Arvind Arora
Keyword(s):  
Electron Emission ◽  
Printed Circuit Boards ◽  
Thickness Measurement ◽  
Circuit Boards ◽  
Limited Data ◽  
Disk Lubricant ◽  
Wafer Processing ◽  
A New Technique ◽  
And Control ◽  
Measurement And Control

This paper presents a new technique to measure thin layer contamination on the surface of a material. The technique uses low wavelength ultraviolet irradiation to generate optically stimulated electron emission, also known as photo electron emission, which can be used to evaluate surface cleanliness or surface chemical state. Limited data is presented to show application of this technique to wafer processing, disk lubricant thickness measurement and quality control of printed circuit boards.

In-situ spectral ellipsometry for real-time thickness measurement and control

1993 ◽  
Author(s):  
Steven A. Henck ◽  
Walter M. Duncan ◽  
Lee M. Loewenstein ◽  
John Kuehne
Keyword(s):  
Real Time ◽  
Thickness Measurement ◽  
Spectral Ellipsometry ◽  
And Control ◽  
Measurement And Control

2. Measurement and Control of Airborne Microorganisms Using Electrostatic Methods

2001 ◽  
Author(s):  
G. Mainelis ◽  
R. Gorny ◽  
K. Willeke ◽  
S. Grinshpun ◽  
T. Reponen ◽  
...  
Keyword(s):  
Airborne Microorganisms ◽  
And Control ◽  
Measurement And Control
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