Impact of high-κgate dielectric and other physical parameters on the electrostatics and threshold voltage of long channel gate-all-around nanowire transistor

2014 ◽  
Vol 28 (4) ◽  
pp. 389-403 ◽  
Author(s):  
Saeed Uz Zaman Khan ◽  
Md. Shafayat Hossain ◽  
Fahim Ur Rahman ◽  
Rifat Zaman ◽  
Md. Obaidul Hossen ◽  
...  
Keyword(s):  
Threshold Voltage ◽  
Physical Parameters ◽  
Nanowire Transistor ◽  
Channel Gate ◽  
Long Channel

Challenges and Solutions of Replacement Metal Gate Patterning to Enable Gate-all-Around Device Scaling

2021 ◽  
Vol 314 ◽  
pp. 119-126
Author(s):  
Yusuke Oniki ◽  
Lars Åke Ragnarsson ◽  
Hideaki Iino ◽  
Daire Cott ◽  
Boon Teik Chan ◽  
...  
Keyword(s):  
Threshold Voltage ◽  
Metal Gate ◽  
Unit Process ◽  
Device Scaling ◽  
Interface Dipole ◽  
Device Integration ◽  
Multiple Threshold ◽  
Long Channel

This paper addresses challenges and solutions of replacement metal gate of gate-all-around nanosheet devices. The unit process and integration solutions for the metal gate patterning as well as interface dipole patterning to offer multiple threshold voltage have been developed. The challenges of long channel device integration are also discussed.

scholarly journals Monitor Circuits for Cross-Layer Resiliency

2020 ◽  
pp. 385-407
Author(s):  
Mahfuzul Islam ◽  
Hidetoshi Onodera
Keyword(s):  
Threshold Voltage ◽  
Design Automation ◽  
Small Area ◽  
Digital Circuit ◽  
Design Flow ◽  
Reconfigurable Architecture ◽  
Physical Parameters ◽  
Cross Layer ◽  
Multiple Parameters

AbstractCross-layer resiliency has become a critical deciding factor for any successful product. This chapter focuses on monitor circuits that are essential in realizing the cross-layer resiliency. The role of monitor circuits is to establish a bridge between the hardware and other layers by providing information about the devices and the operating environment in run-time. This chapter explores delay-based monitor circuits for design automation with the existing cell-based design methodology. The chapter discusses several design techniques to monitor parameters of threshold voltage, temperature, leakage current, critical delay, and aging. The chapter then demonstrates a reconfigurable architecture to monitor multiple parameters with small area footprint. Finally, an extraction methodology of physical parameters is discussed for model-hardware correlation. Utilizing the cell-based design flow, delay-based monitors can be placed inside the target digital circuit and thus a better correlation between monitor and target circuit behavior can be realized.

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