Construction of a Low Cost Photoacoustic Spectrometer for Characterization of Materials

The main limitation of mechanical testing equipments is nowadays centred in the characterization of materials at medium loading rates. This is particularly important in bulk forming because strain rate can easily reach values within the aforesaid range. The aim of this article is twofold: (a) to present the development of a low-cost, flexible drop weight testing equipment that can easily and effectively replicate the kinematic behaviour of presses and hammers and (b) to provide a new level of understanding about the mechanical characterization of materials for bulk forming at medium rates of loading. Special emphasis is placed on the adequacy of test operating conditions to the functional characteristics of the presses and hammers where bulk forming takes place and to its influence on the flow stress. This is needed because non-proportional loading paths during bulk forming are found to have significant influence on material response in terms of flow stress. The quality of the flow curves that were experimentally determined is evaluated through its implementation in a finite-element computer program and assessment is performed by means of axisymmetric upset compression with friction. Results show that mechanical characterization of materials under test operating conditions that are similar to real bulk forming conditions is capable of meeting the increasing demand of accurate and reliable flow stress data for the benefit of those who apply numerical modelling of process design in daily practice.

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A simple and low cost measurement system for the complex permittivity characterization of materials

Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) ◽

10.1109/imtc.2003.1208213 ◽

2004 ◽

Cited By ~ 1

Author(s):

E. Fratticcioli ◽

M. Dionigi ◽

R. Sorrentino

Keyword(s):

Measurement System ◽

Complex Permittivity ◽

Low Cost ◽

Cost Measurement ◽

Characterization Of Materials

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Call for papers on special issue “Current trends in biopolymer-based materials”

Materials International ◽

10.33263/materials21.046046 ◽

2020 ◽

Vol 2 (1) ◽

pp. 046-046

Keyword(s):

Materials Science ◽

Low Cost ◽

Edible Films ◽

Synthetic Polymers ◽

Special Issue ◽

Materials Engineering ◽

Current Trends ◽

Characterization Of Materials ◽

Processing Techniques

Aim & Scope: The importance of materials has been, is and will be very important for life. Recently, the technology of materials is being focused on polymers and composite materials, since with them it is possible to obtain a material with optimal properties for the required application. Specifically, the convergence of materials science with materials engineering leads to the combination of the production and characterization of materials for different specific applications. Nowadays, polymer-based materials have been proposed for different applications like foods (formation and stabilization of foods, supply dietary fibers or micro- and nanoencapsulation), packaging (structural and mechanical properties or edible films), cosmetic and pharmaceutical industry (low cost, sustainability and naturalness, even in regenerative medicine as biomaterials. Aiming to explore these concepts, this Special Issue will focus on the current trends for polymer-based materials and their possible applications, as well as the study of traditional and emerging processing techniques. In addition, different characterization techniques will be evaluated and described. Submissions can cover the following topics (but are not limited to them):– Natural-based polymers; – Polysaccharides and proteins in materials science; – Synthetic polymers in materials science; – Processing of biopolymers; – Nanomaterials. We kindly invite you to submit a manuscript(s) for this Special Issue. Full papers, communications, and reviews are all welcome.

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High-efficient low-cost characterization of materials properties using domain-knowledge-guided self-supervised learning

10.21203/rs.3.rs-1241474/v1 ◽

2022 ◽

Author(s):

Binglin Xie ◽

Xianhua Yao ◽

Weining Mao ◽

Mohammad Rafiei ◽

Nan Hu

Keyword(s):

Supervised Learning ◽

Domain Knowledge ◽

Low Cost ◽

Testing Procedure ◽

High Efficient ◽

Science Community ◽

Properties Of Materials ◽

Material Science Community ◽

Characterization Of Materials

Abstract Modern AI-assisted approaches have helped material scientists revolutionize their abilities to better understand the properties of materials. However, current machine learning (ML) models would perform awful for materials with a lengthy production window and a complex testing procedure because only a limited amount of data can be produced to feed the model. Here, we introduce self-supervised learning (SSL) to address the issue of lacking labeled data in material characterization. We propose a generalized SSL-based framework with domain knowledge and demonstrate its robustness to predict the properties of a candidate material with the fewest data. Our numerical results show that the performance of the proposed SSL model can match the commonly-used supervised learning (SL) model with only 5 % of data, and the SSL model is also proven with ease of implementation. Our study paves the way to expand further the usability of ML tools for a broader material science community.

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Some applications of electron beam microanalysis techniques in VLSI process evaluation

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010007463x ◽

1983 ◽

Vol 41 ◽

pp. 160-161

Author(s):

Simon Thomas

Keyword(s):

Integrated Circuits ◽

Process Evaluation ◽

Large Scale ◽

Technology Development ◽

Analytical Techniques ◽

Successful Implementation ◽

Analysis Of Failures ◽

Characterization Of Materials ◽

Circuits Vlsi

Trends in the technology development of very large scale integrated circuits (VLSI) have been in the direction of higher density of components with smaller dimensions. The scaling down of device dimensions has been not only laterally but also in depth. Such efforts in miniaturization bring with them new developments in materials and processing. Successful implementation of these efforts is, to a large extent, dependent on the proper understanding of the material properties, process technologies and reliability issues, through adequate analytical studies. The analytical instrumentation technology has, fortunately, kept pace with the basic requirements of devices with lateral dimensions in the micron/ submicron range and depths of the order of nonometers. Often, newer analytical techniques have emerged or the more conventional techniques have been adapted to meet the more stringent requirements. As such, a variety of analytical techniques are available today to aid an analyst in the efforts of VLSI process evaluation. Generally such analytical efforts are divided into the characterization of materials, evaluation of processing steps and the analysis of failures.

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Applications of ultramicrotomy for materials characterization

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100147004 ◽

1993 ◽

Vol 51 ◽

pp. 232-233

Author(s):

R.T. Blackham ◽

J.J. Haugh ◽

C.W. Hughes ◽

M.G. Burke

Keyword(s):

Materials Science ◽

Microstructural Analysis ◽

Analytical Electron Microscopy ◽

Austenitic Stainless Steels ◽

Specimen Preparation ◽

Preparation Technique ◽

Thermally Induced ◽

Radiation Induced ◽

Characterization Of Materials

Essential to the characterization of materials using analytical electron microscopy (AEM) techniques is the specimen itself. Without suitable samples, detailed microstructural analysis is not possible. Ultramicrotomy, or diamond knife sectioning, is a well-known mechanical specimen preparation technique which has been gaining attention in the materials science area. Malis and co-workers and Glanvill have demonstrated the usefulness and applicability of this technique to the study of a wide variety of materials including Al alloys, composites, and semiconductors. Ultramicrotomed specimens have uniform thickness with relatively large electron-transparent areas which are suitable for AEM anaysis.Interface Analysis in Type 316 Austenitic Stainless Steel: STEM-EDS microanalysis of grain boundaries in austenitic stainless steels provides important information concerning the development of Cr-depleted zones which accompany M23C6 precipitation, and documentation of radiation induced segregation (RIS). Conventional methods of TEM sample preparation are suitable for the evaluation of thermally induced segregation, but neutron irradiated samples present a variety of problems in both the preparation and in the AEM analysis, in addition to the handling hazard.

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