Spectroscopic Ellipsometry and Microstructure Characterization of Photochromic Oxygen-Containing Yttrium Hydride Thin Films

2018 ◽  
Vol 215 (19) ◽  
pp. 1701039 ◽  
Author(s):  
José Montero ◽  
Smagul Z. Karazhanov
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Microstructure Characterization ◽  
Yttrium Hydride

Oxygen gas sensing and microstructure characterization of sol-gel-prepared MoO3-TiO2 thin films

1999 ◽  
Author(s):  
Yongxiang Li ◽  
Muralihar K. Ghantasala ◽  
Kosmas Galatsis ◽  
Wojtek Wlodarski
Keyword(s):  
Thin Films ◽  
Gas Sensing ◽  
Sol Gel ◽  
Microstructure Characterization ◽  
Tio2 Thin Films ◽  
Oxygen Gas

Optical characterization of CuIn1−xGaxSe2 alloy thin films by spectroscopic ellipsometry

2003 ◽  
Vol 94 (2) ◽  
pp. 879-888 ◽  
Author(s):  
P. D. Paulson ◽  
R. W. Birkmire ◽  
W. N. Shafarman
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Optical Characterization

Characterization of SiN thin films with spectroscopic ellipsometry

1993 ◽  
Vol 185 (1-4) ◽  
pp. 342-347 ◽  
Author(s):  
J. Petalas ◽  
S. Logothetidis ◽  
A. Markwitz ◽  
E.C. Paloura ◽  
R.L. Johnson ◽  
...  
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry

Spectroscopic ellipsometry characterization of Er3+-dopedtitania thin films prepared by the sol-gel method

Optik ◽  
2001 ◽  
Vol 112 (7) ◽  
pp. 316-320 ◽  
Author(s):  
R. Palomino-Merino ◽  
A. Mendoza-Galván ◽  
G. Martínez ◽  
V. Castaño ◽  
R. Rodríguez
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Sol Gel ◽  
Gel Method ◽  
Sol Gel Method

Microstructure characterization of sol-gel prepared MoO3–TiO2 thin films for oxygen gas sensors

2001 ◽  
Vol 19 (3) ◽  
pp. 904-909 ◽  
Author(s):  
Yongxiang Li ◽  
Kosmas Galatsis ◽  
Wojtek Wlodarski ◽  
Muralihdar Ghantasala ◽  
Salvy Russo ◽  
...  
Keyword(s):  
Thin Films ◽  
Gas Sensors ◽  
Sol Gel ◽  
Microstructure Characterization ◽  
Tio2 Thin Films ◽  
Oxygen Gas
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