On a trap ionization mechanism by electric field in CdF2

1985 ◽  
Vol 87 (1) ◽  
pp. K89-K91 ◽  
Author(s):  
P. Pipinys ◽  
A. Rimeika ◽  
A. Kiveris
1969 ◽  
Vol 12 (10) ◽  
pp. 1277-1280
Author(s):  
A. -V. V. Pipinene ◽  
P. A. Pipinis

Author(s):  
Hui Zhu ◽  
N. E. Mastorakis ◽  
Qingquan Lei

Simulation analysis plays an important role in Systems Theory nowadays. In order to reveal the mechanism of space charge injection and generation in the process of liquid dielectric breakdown, the discharge of transformer oil between needle-plane electrodes under high electric field is studied. Based on the 2-D hydrodynamic model and Poisson equation of electric field, the system simulation model of oil discharge by different charge generation mechanism is established, based on which the inception and propagation process of discharge is simulated by COMSOL. By system simulation, the temporal and spatial distribution of the electric field intensity, space charge density, electric potential and temperature of transformer oil is obtained and deeply analyzed. The simulation results prove that the space charge generated by metal field emission and ionic disassociation are neither of the major factor for streamer formation in transformer oil, while the Zener molecular ionization and impact ionization are the major factors. Our research improves the understanding of the inception, propagation and breakdown process for discharge in transformer oil, and also the ionization mechanism in the liquid dielectric


Author(s):  
G. F. Rempfer

In photoelectron microscopy (PEM), also called photoemission electron microscopy (PEEM), the image is formed by electrons which have been liberated from the specimen by ultraviolet light. The electrons are accelerated by an electric field before being imaged by an electron lens system. The specimen is supported on a planar electrode (or the electrode itself may be the specimen), and the accelerating field is applied between the specimen, which serves as the cathode, and an anode. The accelerating field is essentially uniform except for microfields near the surface of the specimen and a diverging field near the anode aperture. The uniform field forms a virtual image of the specimen (virtual specimen) at unit lateral magnification, approximately twice as far from the anode as is the specimen. The diverging field at the anode aperture in turn forms a virtual image of the virtual specimen at magnification 2/3, at a distance from the anode of 4/3 the specimen distance. This demagnified virtual image is the object for the objective stage of the lens system.


Author(s):  
Patrick P. Camus

The theory of field ion emission is the study of electron tunneling probability enhanced by the application of a high electric field. At subnanometer distances and kilovolt potentials, the probability of tunneling of electrons increases markedly. Field ionization of gas atoms produce atomic resolution images of the surface of the specimen, while field evaporation of surface atoms sections the specimen. Details of emission theory may be found in monographs.Field ionization (FI) is the phenomena whereby an electric field assists in the ionization of gas atoms via tunneling. The tunneling probability is a maximum at a critical distance above the surface,xc, Fig. 1. Energy is required to ionize the gas atom at xc, I, but at a value reduced by the appliedelectric field, xcFe, while energy is recovered by placing the electron in the specimen, φ. The highest ionization probability occurs for those regions on the specimen that have the highest local electric field. Those atoms which protrude from the average surfacehave the smallest radius of curvature, the highest field and therefore produce the highest ionizationprobability and brightest spots on the imaging screen, Fig. 2. This technique is called field ion microscopy (FIM).


1993 ◽  
Vol 3 (8) ◽  
pp. 1201-1225 ◽  
Author(s):  
G. N�ron de Surgy ◽  
J.-P. Chabrerie ◽  
O. Denoux ◽  
J.-E. Wesfreid

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