Characterization of point defects in ZnO thin films by optical deep level transient spectroscopy
2010 ◽
Vol 248
(4)
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pp. 941-949
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2018 ◽
Vol 924
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pp. 253-256
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2003 ◽
Vol 47
(10)
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pp. 1623-1629
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Keyword(s):
2008 ◽
Vol 19
(S1)
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pp. 281-284
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Keyword(s):
Keyword(s):
Keyword(s):
2016 ◽
Vol 55
(2)
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pp. 026601
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