Reliability of multi-channel Ga1−xAlxas high electron mobility transistor (HEMT) integrated circuits

1991 ◽  
Vol 7 (6) ◽  
pp. 461-467
Author(s):  
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Wen Tseng
2019 ◽  
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...  

2006 ◽  
Vol 45 (No. 35) ◽  
pp. L932-L934 ◽  
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