Nanocrystal‐enabled front surface bandgap gradient for the reduction of surface recombination in inverted perovskite solar cells

Solar RRL ◽  
2021 ◽  
Author(s):  
Zhiwei Xu ◽  
Mingxuan Guo ◽  
Jun Bo ◽  
Xingtong Chen ◽  
Peng Wan ◽  
...  
Nano Energy ◽  
2020 ◽  
Vol 67 ◽  
pp. 104186 ◽  
Author(s):  
Damian Głowienka ◽  
Dong Zhang ◽  
Francesco Di Giacomo ◽  
Mehrdad Najafi ◽  
Sjoerd Veenstra ◽  
...  

2018 ◽  
Vol 5 (21) ◽  
pp. 1801076 ◽  
Author(s):  
Jesús Idígoras ◽  
Lidia Contreras-Bernal ◽  
James M. Cave ◽  
Nicola E. Courtier ◽  
Ángel Barranco ◽  
...  

2016 ◽  
Vol 7 (24) ◽  
pp. 5105-5113 ◽  
Author(s):  
Isaac Zarazua ◽  
Guifang Han ◽  
Pablo P. Boix ◽  
Subodh Mhaisalkar ◽  
Francisco Fabregat-Santiago ◽  
...  

2017 ◽  
Vol 2 (2) ◽  
pp. 424-430 ◽  
Author(s):  
Kristofer Tvingstedt ◽  
Lidón Gil-Escrig ◽  
Cristina Momblona ◽  
Philipp Rieder ◽  
David Kiermasch ◽  
...  

MRS Advances ◽  
2020 ◽  
Vol 5 (50) ◽  
pp. 2603-2610
Author(s):  
Jared D. Friedl ◽  
Ramez Hosseinian Ahangharnejhad ◽  
Adam B. Phillips ◽  
Michael J. Heben

AbstractPerovskite solar cells continue to garner significant attention in the field of photovoltaics. As the optoelectronic properties of the absorbers become better understood, attention has turned to more deeply understanding the contribution of charge transport layers for efficient extraction of carriers. Titanium oxide is known to be an effective electron transport layer (ETL) in planar perovskite solar cells, but it is unlikely to result in the best device performance possible. To investigate the importance of band energy alignment between the electron transport layer and perovskite, we employ numerical modeling as a function of conduction band offset between these layers, interface recombination velocity, and ETL doping levels. Our simulations offer insight into the advantages of energy band alignment and allow us to determine a range of surface recombination velocities and ETL doping densities that will allow us to identify novel high performance ETL materials.


2013 ◽  
Vol 205-206 ◽  
pp. 346-351 ◽  
Author(s):  
Ruy S. Bonilla ◽  
Christian Reichel ◽  
Martin Hermle ◽  
Peter R. Wilshaw

Effective reduction of front surface carrier recombination is essential for high efficiency silicon solar cells. Dielectric films are normally used to achieve such reduction. They provide a) an efficient passivation of surface recombination and b) an effective anti-reflection layer. The conditions that produce an effective anti-reflection coating are not necessarily the same for efficient passivation, hence both functions are difficult to achieve simultaneously and expensive processing steps are normally required. This can be overcome by enhancing the passivation properties of an anti-reflective film using the electric field effect. Here, we demonstrate that thermally grown silicon dioxide is an efficient passivation layer when chemically treated and electrically charged, and it is stable over a period of ten months. Double layers of SiO2 and SiN also provided stable and efficient passivation for a period of a year when the sample is submitted to a post-charge anneal. Surface recombination velocity upper limits of 9 cm/s and 19 cm/s were inferred for single and double layers respectively on n-type, 5 Ωcm, Cz-Si.


Sign in / Sign up

Export Citation Format

Share Document