Determination of the Crystallite Size and Shape in Substituted Barium Hexaferrite by X-Ray Line Broadening Analysis

1995 ◽  
Vol 114 (2) ◽  
pp. 534-538 ◽  
Author(s):  
M.V. Cabañas ◽  
P. Germi ◽  
J.M. González-Calbet ◽  
M. Pernet ◽  
M. Vallet-Regı́
Keyword(s):  
Crystallite Size ◽  
Barium Hexaferrite ◽  
Line Broadening ◽  
X Ray ◽  
Size And Shape ◽  
Substituted Barium Hexaferrite

The Use of the Pseudo-Voigt Function in the Variance Method of X-ray Line-Broadening Analysis

1997 ◽  
Vol 30 (4) ◽  
pp. 427-430 ◽  
Author(s):  
F. Sánchez-Bajo ◽  
F. L. Cumbrera
Keyword(s):  
Crystallite Size ◽  
Original Form ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
Stabilized Zirconia ◽  
X Ray ◽  
Variance Method ◽  
The Mean ◽  
Voigt Function

A modified application of the variance method, using the pseudo-Voigt function as a good approximation to the X-ray diffraction profiles, is proposed in order to obtain microstructural quantities such as the mean crystallite size and root-mean-square (r.m.s.) strain. Whereas the variance method in its original form is applicable only to well separated reflections, this technique can be employed in the cases where there is line-profile overlap. Determination of the mean crystallite size and r.m.s. strain for several crystallographic directions in a nanocrystalline cubic sample of 9-YSZ (yttria-stabilized zirconia) has been performed by means of this procedure.

scholarly journals Microstructures, Magnetic Properties and Microwave Absorption Characteristics of Ti2+ -Mn4+Substituted Barium Hexaferrite

2016 ◽  
Vol 14 (1) ◽  
pp. 15 ◽  
Author(s):  
Maykel Manawan ◽  
Azwar Manaf ◽  
Bambang Soegijono ◽  
Asep Yudi Hercuadi
Keyword(s):  
Crystallite Size ◽  
Microwave Absorption ◽  
Single Phase ◽  
Barium Hexaferrite ◽  
Grain Morphology ◽  
X Ray Diffraction ◽  
Mechanically Alloyed ◽  
X Ray ◽  
Xrd Patterns ◽  
Substituted Barium Hexaferrite

The effect of Ti2+-Mn4+substitution on microwave absorption has been studied for BaFe12-2xTixMnxO19 ferrite, where x varies from 0.2, 0.4, 0.6 and 0.8.Ti2+-Mn4+ ions were obtained from TiO and MnO2 precursors which were mechanically alloyed together with BaCO3 and Fe2O3 precursors. X-ray diffraction (XRD) patterns for sintered samples confirmed that the materials are consisted with single phase BHF structure. Unit cell volume and crystallite size was found increase with increasing x. Crystallite size for all samples below 70 nm, but the grain morphology shown that the grains is in range of 200 - 400 nm, which concluded that each grain are polycrystalline. The saturation magnetization is increases up to x = 0.4 and decrease for higher x values, while the coercivity remains decreases monotonically. These results were interpreted in terms of the site preferential occupation of Ti2+ and Mn4+ at low level substitution.These substitution revealed of enhanced reflection loss (RL) up to 25 dB forx=0.6.It suggested that the synthesized can be employed as effective microwave absorbers in various devices.

Monte Carlo determination of crystallite size of porous silicon from x-ray line broadening

2005 ◽  
Vol 87 (21) ◽  
pp. 211906 ◽  
Author(s):  
R. J. Martín-Palma ◽  
L. Pascual ◽  
P. Herrero ◽  
J. M. Martínez-Duart
Keyword(s):  
Monte Carlo ◽  
Porous Silicon ◽  
Crystallite Size ◽  
Line Broadening ◽  
X Ray

X-Ray Diffraction Analysis on Crystallite Development of Nanostructured Aluminium

2006 ◽  
Vol 118 ◽  
pp. 53-58
Author(s):  
Elisabeth Meijer ◽  
Nicholas Armstrong ◽  
Wing Yiu Yeung
Keyword(s):  
Crystallite Size ◽  
Room Temperature ◽  
Annealing Temperature ◽  
Equal Channel Angular Extrusion ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
Integral Breadth ◽  
X Ray ◽  
Heat Treated ◽  
Diffraction Peaks

This study is to investigate the crystallite development in nanostructured aluminium using x-ray line broadening analysis. Nanostructured aluminium was produced by equal channel angular extrusion at room temperature to a total deformation strain of ~17. Samples of the extruded metal were then heat treated at temperatures up to 300oC. High order diffraction peaks were obtained using Mo radiation and the integral breadth was determined. It was found that as the annealing temperature increased, the integral breadth of the peak reflections decreased. By establishing the modified Williamson-Hall plots (integral breadth vs contract factor) after instrumental correction, it was determined that the crystallite size of the metal was maintained ~80 nm at 100oC. As the annealing temperature increased to 200oC, the crystallite size increased to ~118 nm. With increasing annealing temperature, the hardness of the metal decreased from ~60 HV to ~45 HV.

An X-ray study of the crystal-structure of antigorite (With Plate V)

1945 ◽  
Vol 27 (188) ◽  
pp. 65-74 ◽  
Author(s):  
Endel Aruja
Keyword(s):  
Crystal Structure ◽  
Chemical Composition ◽  
Line Broadening ◽  
X Ray ◽  
Complete Determination

Antigorite is a lamellar variety of serpentine, and is supposed to be a dimorphous form of chrysotile, which is finely fibrous. Its chemical composition is approximately H4Mg3Si2O9, which is taken as the basis of calculations here.This study was undertaken primarily because it was hoped that knowledge of the structure of antigorite would throw some light on that of chrysotile. Certain similarities between the two structures have been established, namely in the c(7·3kX or 14·6kX), and b(9·2kX) directions. There are two main differences, however. Firstly, imperfections which cause line broadening in the X-ray pattern of chrysotile, are absent in antigorite (apart from certain ‘streaks’). Secondly, the a(43·4kX) axis of antigorite is approximately eight times longer than the corresponding axis in chrysotile. A complete determination of the structure has not been achieved, but the X-ray pattern has been described, and some suggestions made as to the explanation of the peculiarities observed. A further study of the outstanding questions is in progress.

Determination of Strain Distributions in Aluminum Thin Films as a Function of Temperature by the use of Synchrotron Grazing Incidence X-Ray Scattering

1991 ◽  
Vol 239 ◽  
Author(s):  
Ramnath Venkatraman ◽  
Paul R. Besser ◽  
Sean Brennan ◽  
John C. Bravman
Keyword(s):  
Thin Films ◽  
Room Temperature ◽  
Grazing Incidence ◽  
Surface Relaxation ◽  
Line Broadening ◽  
X Ray ◽  
Relaxation Effects ◽  
X Ray Scattering ◽  
Ray Scattering

ABSTRACTWe have measured elastic strain distributions with depth as a function of temperature in Al thin films of various thicknesses on oxidized silicon using synchrotron grazing incidence X-ray scattering (GIXS). Disregarding minor surface relaxation effects that depend on the film thickness, it is shown that there are no gross strain gradients in these films in the range of temperatures (between room temperature and 400°C) considered. We also observe X-ray line broadening effects, suggesting an accumulation of dislocations on cooling the films, and their annealing out as the films are reheated.

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