TOXIC CHROMIUM ANALYSED BY PIXE

1992 ◽  
Vol 02 (03) ◽  
pp. 305-308 ◽  
Author(s):  
FINN FOLKMANN

Exciting different Cr-containing chemical compounds with heavy ions, e.g. 1.4 MeV/u 12C16O and 35Cl K x rays from Cr were measured with high resolution by diffraction in a curved crystal and with a position sensitive detector. Small differences are seen for different compounds and valancy states 3 and 6 of Cr (6 is toxic).

1978 ◽  
Vol 11 (3) ◽  
pp. 173-178 ◽  
Author(s):  
E. Prince ◽  
A. Wlodawer ◽  
A. Santoro

The recent development of linear position-sensitive detectors for neutrons and X-rays leads to the possibility of large improvements in the efficiency of data collection in single-crystal diffractometers. In order to take advantage of the properties of a linear position-sensitive detector it is desirable to use a diffraction geometry which causes the diffracted beams from many different reflecting planes to lie in a common plane. A design for a diffractometer utilizing the flat-cone geometry is described, and the relevant mathematical formulas are summarized. An instrument using this design has been constructed as a modification to an existing four-circle diffractometer and is now operating. Practical details of its construction, of the collection and handling of data, and of data rates are discussed.


1992 ◽  
Vol 36 ◽  
pp. 617-622
Author(s):  
J. L. Radtke ◽  
D. W. Beard

AbstractPosition sensitive detectors provide efficient X-ray detection over large solid angles; this capability has revolutionized X-ray diffractometry by reducing data collection time. This paper describes testing of a new single-axis position sensitive detector designed to locate 0.6-2 Angstrom X-rays. Dead time, quantum efficiency, energy resolution, and spatial resolution were measured. Standard powder diffraction patterns were observed with the detector, and data sets are presented. The impact of detector performance parameters on diffraction experiments is discussed.


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