Design for Delay Fault Testability

Frontiers in Electronic Testing - Delay Fault Testing for VLSI Circuits ◽

10.1007/978-1-4615-5597-1_8 ◽

1998 ◽

pp. 131-155

Author(s):

Angela Krstić ◽

Kwang-Ting Cheng

Keyword(s):

Delay Fault

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Power Supply Voltage Control for Eliminating Overkills and Underkills in Delay Fault Testing

IEICE Transactions on Electronics ◽

10.1587/transele.e99.c.1219 ◽

2016 ◽

Vol E99.C (10) ◽

pp. 1219-1225

Author(s):

Masahiro ISHIDA ◽

Toru NAKURA ◽

Takashi KUSAKA ◽

Satoshi KOMATSU ◽

Kunihiro ASADA

Keyword(s):

Power Supply ◽

Supply Voltage ◽

Voltage Control ◽

Fault Testing ◽

Power Supply Voltage ◽

Delay Fault ◽

Delay Fault Testing

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Power Supply Noise-Aware Scan Test Pattern Reshaping for At-Speed Delay Fault Testing of Monolithic 3D ICs *

2020 IEEE 29th Asian Test Symposium (ATS) ◽

10.1109/ats49688.2020.9301568 ◽

2020 ◽

Author(s):

Shao-Chun Hung ◽

Yi-Chen Lu ◽

Sung Kyu Lim ◽

Krishnendu Chakrabarty

Keyword(s):

Power Supply ◽

Test Pattern ◽

Power Supply Noise ◽

Fault Testing ◽

Delay Fault ◽

Delay Fault Testing ◽

3D Ics ◽

Scan Test ◽

Supply Noise

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Transition delay fault testing of 3D ICs with IR-drop study

2012 IEEE 30th VLSI Test Symposium (VTS) ◽

10.1109/vts.2012.6231065 ◽

2012 ◽

Cited By ~ 4

Author(s):

Shreepad Panth ◽

Sung Kyu Lim

Keyword(s):

Fault Testing ◽

Delay Fault ◽

Delay Fault Testing ◽

Ir Drop ◽

3D Ics ◽

Transition Delay

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A new classification of path-delay fault testability in terms of stuck-at faults

Journal of Computer Science and Technology ◽

10.1007/bf02973460 ◽

2004 ◽

Vol 19 (6) ◽

pp. 955-964 ◽

Cited By ~ 2

Author(s):

Subhashis Majumder ◽

Bhargab B. Bhattacharya ◽

Vishwani D. Agrawal ◽

Michael L. Bushnell

Keyword(s):

Path Delay ◽

New Classification ◽

Delay Fault ◽

Path Delay Fault

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Time Delay Fault Tolerant Controller for Actuator Failures during Aircraft Autolanding

TRANSACTIONS OF THE JAPAN SOCIETY FOR AERONAUTICAL AND SPACE SCIENCES ◽

10.2322/tjsass.55.175 ◽

2012 ◽

Vol 55 (3) ◽

pp. 175-182 ◽

Cited By ~ 1

Author(s):

Jangho LEE ◽

Hyoung Sik CHOI ◽

Sangjong LEE ◽

Eung Tai KIM ◽

Dongho SHIN

Keyword(s):

Time Delay ◽

Fault Tolerant ◽

Delay Fault ◽

Actuator Failures

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Protocol Design and Optimization for Delay/Fault-Tolerant Mobile Sensor Networks

10.1109/icdcs.2007.129 ◽

2007 ◽

Cited By ~ 13

Author(s):

Yu Wang ◽

Hongyi Wu ◽

Feng Lin ◽

Nian-Feng Tzeng

Keyword(s):

Sensor Networks ◽

Fault Tolerant ◽

Mobile Sensor Networks ◽

Protocol Design ◽

Mobile Sensor ◽

Delay Fault ◽

Design And Optimization

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Path Delay Fault Classification

Frontiers in Electronic Testing - Delay Fault Testing for VLSI Circuits ◽

10.1007/978-1-4615-5597-1_5 ◽

1998 ◽

pp. 45-76

Author(s):

Angela Krstić ◽

Kwang-Ting Cheng

Keyword(s):

Fault Classification ◽

Path Delay ◽

Delay Fault ◽

Path Delay Fault

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Path delay fault simulation algorithms for sequential circuits

Proceedings First Asian Test Symposium (ATS `92) ◽

10.1109/ats.1992.224444 ◽

2003 ◽

Cited By ~ 13

Author(s):

T.J. Chakraborty ◽

V.D. Agrawal ◽

M.L. Bushnell

Keyword(s):

Fault Simulation ◽

Sequential Circuits ◽

Path Delay ◽

Delay Fault ◽

Path Delay Fault ◽

Simulation Algorithms

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On the design of path delay fault testable combinational circuits

[1990] Digest of Papers. Fault-Tolerant Computing: 20th International Symposium ◽

10.1109/ftcs.1990.89391 ◽

2002 ◽

Cited By ~ 78

Author(s):

A.K. Pramanick ◽

S.M. Reddy

Keyword(s):

Path Delay ◽

Combinational Circuits ◽

Delay Fault ◽

Path Delay Fault

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New advances in path delay fault testing of combinational circuits

Proceedings of IEEE VLSI Test Symposium ◽

10.1109/vtest.1994.292301 ◽

2002 ◽

Cited By ~ 3

Author(s):

X. Xie ◽

A. Albicki

Keyword(s):

Path Delay ◽

Combinational Circuits ◽

Fault Testing ◽

Delay Fault ◽

Delay Fault Testing ◽

Path Delay Fault ◽

Path Delay Fault Testing

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