Nondestructive Characterization of the Structure and Mechanical Properties of Metallic Superlattice Thin Films

1991 ◽  
pp. 9-14
Author(s):  
T. E. Schlesinger ◽  
R. C. Cammarata ◽  
C. Kim ◽  
S. B. Qadri ◽  
A. S. Edelstein
Keyword(s):  
Thin Films ◽  
Mechanical Properties ◽  
Nondestructive Characterization

Photoacoustic characterization of the mechanical properties of thin films

2002 ◽  
Vol 80 (4) ◽  
pp. 691-693 ◽  
Author(s):  
Carmen M. Hernandez ◽  
Todd W. Murray ◽  
Sridhar Krishnaswamy
Keyword(s):  
Thin Films ◽  
Mechanical Properties

Characterization of Nanoporous Low Dielectric Polysilsesquioxane Thin Films

2005 ◽  
Vol 277-279 ◽  
pp. 907-911
Author(s):  
Jingyu Hyeon Lee ◽  
Yi Yeol Lyu ◽  
Mong Sup Lee ◽  
Jin Heong Yim ◽  
Sang Youl Kim
Keyword(s):  
Thin Films ◽  
Mechanical Properties ◽  
Dielectric Constant ◽  
Refractive Index ◽  
Elastic Modulus ◽  
Polymer Matrix ◽  
Low Dielectric

Poly(methyl-co-cyclosiloxane bearing silsesquioxane)s (P(M-co-CSSQs)) were prepared. Using poly(e-caprolactone) (PCL) as a template, PCL / P(M-co-CSSQ) nanohybrid films were fabricated. The electrical, morphological, and mechanical properties of the PCL / P(M-co-CSSQ) films were investigated. The dielectric constant of a cured PCL / P(M-co-CSSQ) film at 420°C scaled down from 2.55 to 2.05 and refractive index from 1.41 to 1.33 when 20 vol. % of the PCL was admixed with the polymer matrix. The elastic modulus and hardness of the cured PCL / P(Mco- CSSQ) (2:8, vol./vol.) film were 2.50 and 0.32 GPa, respectively, showing dependency on the PCL content.

Characterization of mechanical properties of thin films using nanoindentation test

2006 ◽  
Vol 38 (12) ◽  
pp. 1182-1198 ◽  
Author(s):  
Hervé Pelletier ◽  
Joël Krier ◽  
Pierre Mille
Keyword(s):  
Thin Films ◽  
Mechanical Properties ◽  
Nanoindentation Test

Nondestructive characterization of surface resistance for copper(II) phthalocyanine thin films using a near-field scanning microwave microscope

2005 ◽  
Vol 275 (1-2) ◽  
pp. e1863-e1867
Author(s):  
Miehwa Park ◽  
Hyunjun Yoo ◽  
Eunju Lim ◽  
Jae-yong Kim ◽  
Kiejin Lee ◽  
...  
Keyword(s):  
Thin Films ◽  
Surface Resistance ◽  
Near Field ◽  
Microwave Microscope ◽  
Near Field Scanning ◽  
Nondestructive Characterization
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