Impact of Electron Beam Irradiation on the Nutritional Attributes of Seeds of Coastal Sand Dune Wild Legume Canavalia cathartica

2019 ◽  
pp. 607-625
Author(s):  
Prabhavathi Supriya ◽  
Kandikere R. Sridhar ◽  
Ananthapadmanabha B. Arun
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Sand Dune ◽  
Beam Irradiation ◽  
Coastal Sand Dune ◽  
Coastal Sand ◽  
Wild Legume

Impact of Electron Beam Irradiation on the Bioactive Principles of Seeds of Coastal Sand Dune Wild Legumes (Canavalia spp.)

2019 ◽  
Vol 10 (1) ◽  
pp. 57-61
Author(s):  
Prabhavathi Supriya ◽  
Kandikere R. Sridhar
Keyword(s):  
Electron Beam ◽  
Sand Dune ◽  
Total Phenolics ◽  
Bioactive Components ◽  
Coastal Sand Dune ◽  
Wild Legumes ◽  
Coastal Sand ◽  
Dose Dependent Increase ◽  
Dose Dependent ◽  
Different Doses

Background: Recent patents reveal that vegetable ingredients have several applications in novel food formulations. Many so-called antinutritional components (e.g. tannins, saponins, lectins and protease inhibitors) have nutraceutical as well as pharmaceutical significance. Seeds of two wild legumes of the genus Canavalia inhabitants of the coastal sand dunes of Southwest India are known for a variety of bioactive principles (e.g. phenolics, tannins, canavanine, concanavalin and phytohemagglutinins). </P><P> Objective: This study evaluates the impact of Electron Beam (EB) irradiation on the bioactive components of seeds of two coastal sand dune wild legumes Canavalia cathartica and C. maritima. </P><P> Methods: The dry seeds of C. cathartica and C. maritima were EB irradiated with different doses (2.5, 5, 10 and 15 kGy) to follow changes in six bioactive principles (total phenolics, orthodihydric phenols, tannins, canavanine, trypsin inhibitors and phytohemagglutinins) in comparison to control seeds. One-way ANOVA was employed to follow the variation in bioactive components of seeds in control and different doses of irradiation. </P><P> Results: Seeds of both legumes were devoid of orthodihydric phenols and trypsin inhibitors. In C. cathartica, the total phenolics showed significant dose-dependent increase up to 5 kGy and decreased thereafter. Tannin content was not altered up to 10 kGy followed by significant decrease at 15 kGy. There was no significant change in canavanine content and the phytohemagglutinin activity against human erythrocytes was not altered. Seeds of C. maritima did not show significant changes in total phenolics as well as tannin contents. The content of canavanine showed significant dose-dependent increase up to 5 kGy followed by significant decrease. There was no variation in phytohemagglutinin activity against erythrocytes A, B and O, while against AB, the activity decreased at 2.5 kGy and further decrease was constant at higher doses. </P><P> Conclusion: The EB irradiation doses employed have selectively altered the bioactive principles of Canavalia seeds and such treatments may facilitate to maneuver desired medicinal, nutritional, functional and cooking properties. Besides selective changes in bioactive components the seeds have extended shelf life.

Methods to Monitor and Improve the Performance of Specimen Holders for Transmission Electron Cryomicroscopy

1996 ◽  
Vol 54 ◽  
pp. 454-455
Author(s):  
B. L. Armbruster ◽  
B. Kraus ◽  
M. Pan
Keyword(s):  
Electron Microscopy ◽  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
Quality Of Data ◽  
Electron Cryomicroscopy ◽  
Thermal Equilibration ◽  
Transmission Electron ◽  
Electron Microscopes

One goal in electron microscopy of biological specimens is to improve the quality of data to equal the resolution capabilities of modem transmission electron microscopes. Radiation damage and beam- induced movement caused by charging of the sample, low image contrast at high resolution, and sensitivity to external vibration and drift in side entry specimen holders limit the effective resolution one can achieve. Several methods have been developed to address these limitations: cryomethods are widely employed to preserve and stabilize specimens against some of the adverse effects of the vacuum and electron beam irradiation, spot-scan imaging reduces charging and associated beam-induced movement, and energy-filtered imaging removes the “fog” caused by inelastic scattering of electrons which is particularly pronounced in thick specimens.Although most cryoholders can easily achieve a 3.4Å resolution specification, information perpendicular to the goniometer axis may be degraded due to vibration. Absolute drift after mechanical and thermal equilibration as well as drift after movement of a holder may cause loss of resolution in any direction.

Nước dưới đất trong cồn cát ven biển phía nam Quảng Bình và định hướng khai thác sử dụng

2018 ◽  
Vol 28 (3) ◽  
pp. 336-345
Author(s):  
Nguyễn Xuân Tặng
Keyword(s):  
Sand Dune ◽  
Coastal Sand Dune ◽  
The South ◽  
Coastal Sand ◽  
Dune Area

Groundwater in coastal sand dune area in the south of Quang Binh province and posibility for exploitation

A Study of Electron Beam Irradiation Influence on Device Contact Junction Characteristics of Advanced DRAM Using Atomic Force Probing

2013 ◽  
Author(s):  
Wei-Chih Wang ◽  
Jian-Shing Luo
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Forward Bias ◽  
Irradiation Damage ◽  
Beam Irradiation ◽  
Excess Current ◽  
Atomic Force ◽  
Order Of Magnitude ◽  
Voltage Contrast ◽  
Acceleration Voltage

Abstract In this paper, we revealed p+/n-well and n+/p-well junction characteristic changes caused by electron beam (EB) irradiation. Most importantly, we found a device contact side junction characteristic is relatively sensitive to EB irradiation than its whole device characteristic; an order of magnitude excess current appears at low forward bias region after 1kV EB acceleration voltage irradiation (Vacc). Furthermore, these changes were well interpreted by our Monte Carlo simulation results, the Shockley-Read Hall (SRH) model and the Generation-Recombination (G-R) center trap theory. In addition, four essential examining items were suggested and proposed for EB irradiation damage origins investigation and evaluation. Finally, by taking advantage of the excess current phenomenon, a scanning electron microscope (SEM) passive voltage contrast (PVC) fault localization application at n-FET region was also demonstrated.

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