Metrological Traceability and Measurement Uncertainty

2020 ◽  
pp. 243-254
Author(s):  
Laurel Farrell ◽  
Tate Yeatman
2017 ◽  
Vol 66 (4) ◽  
pp. 217-228
Author(s):  
Przemysław Piróg ◽  
Mariusz Górecki

The article discusses the method used in the Central Military Calibration Laboratory to calibrate Fluke 5790 AC/DC transfer standard with reference transfer standard Fluke 792A. It presents the measurement equation and the uncertainty budget. The contribution of uncertainty components in the measurement uncertainty has been presented. The metrological traceability has been evaluated by comparing calibration results with the results in the last Fluke certificate of calibration. Keywords: AC/DC converters, AC/DC difference, thermal voltage converters (TVCs), AC voltage measurement.


Author(s):  
S.S.S. AL-BUSAIDI ◽  
◽  
S.V. PONOMAREV ◽  

The execution order of the processes of the management system (MS) of the testing laboratory (TL), certified according to the requirements of the standard GOST ISO / IEC 17025-2019, is discussed. It was established that the process “8.9 Management Review” is the main process in managing activities in a testing laboratory. The interaction of this process with other MS TL processes is considered, in particular: “6.2 Personnel”, “6.4 Equipment”, “6.5 Metrological traceability”, “7.2 Selection, verification and validation of methods”, “7.6 Evaluation of measurement uncertainty”, “7.7 Ensuring the validity of results”, “7.10 Management of inappropriate work”, “8.5 Actions related to risks and opportunities”, “8.6 Improvement”, “8.7 Corrective actions”, “ 8.8. Internal Audits”, etc.


Author(s):  
Oleh Velychko ◽  
Tetyana Gordiyenko

International agreements in the field of metrology and accreditation of calibration laboratories are the basis for establishing global metrological traceability. Important elements of metrological traceability are calibration of measurement standards and measuring instruments, assessment of measurement uncertainty. The International Laboratory Accreditation Cooperation has a specific policy regarding on traceability of measurement results and estimation of measurement uncertainty in calibration. The partial concept diagram around metrological traceability in accordance with the International Vocabulary of Metrology is proposed. This diagram contains a total of nine metrological concepts, which have most of the associative relations. There are associative relations between the concept of metrological traceability chain and concepts of metrological traceability, measurement standard, calibration and calibration hierarchy, and through the concept of measurement standard with the concept of measurement uncertainty. Systems thinking to the analysis of state of proposed terminological system around metrological traceability was applied. For construction of generalized metrological traceability chain, all the established properties of the system elements around the terminology system of metrological traceability were taken into account. Generalized metrological traceability chain for different levels of the calibration hierarchy was proposed. The proposed chain can be used to develop appropriate chains for specific areas of measurement. To achieve this, it is necessary to determine the specific measured value, the required measurement uncertainty for different levels of the calibration hierarchy and select the necessary measurement standards. Such schemes should be used in national metrology institutes and calibration laboratories.


2018 ◽  
Vol 90 (3) ◽  
pp. 563-603 ◽  
Author(s):  
Maria F. Camões ◽  
Gary D. Christian ◽  
David Brynn Hibbert

Abstract This technical report reviews measurements of mass and volume, including a review of the SI for mass, length, and amount of substance; principles of mass measurement; calibration of masses and glassware; gravimetry; volumetry; and titrimetry. Measurement uncertainty, metrological traceability and aspects of quality assurance are also treated.


2014 ◽  
Vol 613 ◽  
pp. 101-107
Author(s):  
Dominic Gnieser ◽  
Carl Georg Frase ◽  
Harald Bosse ◽  
Rainer Tutsch

To assure the metrological traceability of a measurement, it is required to perform an analysis of the measurement uncertainty specific to the measurement task. An approach to estimate the measurement uncertainty for complex systems is the so-called virtual measuring instrument: The measuring process is simulated taking into account its influencing parameters and a statistical analysis is performed by means of Monte-Carlo calculations. We present the development of such a virtual measuring instrument for scanning electron microscopy (SEM) which allows to estimate the measurement uncertainty in compliance with GUM for dimensional measuring tasks in nano- and microsystems technology. By application of this virtual instrument, model based corrections of systematic errors are made possible and the cognition of the strength of different perturbing influences can lead to recommendations to optimize measurement instruments and methods. The virtual model programmed in MATLAB is called ‘vREM’, it includes all essential components of the measuring chain of an SEM as modules: The electron source, the electron-optical lens-system, the scan-generator, the interaction of the electrons within the object, electron detectors, simple analysis procedures and consideration of external disturbances. By adjusting parameters uncertainty contributions can be assigned to the virtual probe, the virtual specimen and the virtual detector signals.


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