Energy Predictions for System on a Chip Solutions

2021 ◽  
pp. 243-250
Author(s):  
Luis Gomes ◽  
Zita Vale
Keyword(s):  
Author(s):  
Kai Wang ◽  
Rhys Weaver ◽  
David Johnson

Abstract A systemic analysis was chosen to evaluate a real case Bluetooth (BT) radio failure in the aspects of RF communication, digital design, firmware, application software, semiconductor device physics and processing, and failure analysis. This paper explores the range of testing, including customer application testing, required to confirm and localize a BT RF communication failure. It shows that the radio communication failure was not, as expected, caused by faulty radio hardware; it was rather linked to problematic encryption hardware at the assistance of the Synergy BT to mobile application. The paper also explores that the digital fault can only be detected by the timing sensitive transition fault scan patterns and how to obtain the physical failure location. Thus, the combination of ATPG and application testing provides a consistency between electrical diagnostics which yields a higher success rate at subsequent physical failure analysis of complex modern RF System on a Chip.


2010 ◽  
Vol 24 (1) ◽  
pp. 23-28
Author(s):  
Yiming Ouyang ◽  
Baosheng Zou ◽  
Huaguo Liang ◽  
Xi’e Huang

2004 ◽  
Vol 70 (3) ◽  
pp. 229-244 ◽  
Author(s):  
W. Cesário ◽  
L. Gauthier ◽  
D. Lyonnard ◽  
G. Nicolescu ◽  
A.A. Jerraya

Author(s):  
Hoon Choi ◽  
Myung-Kyoon Yim ◽  
Jae-Young Lee ◽  
Byeong-Whee Yun ◽  
Yun-Tae Lee

Mathematics ◽  
2021 ◽  
Vol 9 (10) ◽  
pp. 1085
Author(s):  
Ilya E. Tarasov

This article discusses the application of the method of approximation of experimental data by functional dependencies, which uses a probabilistic assessment of the deviation of the assumed dependence from experimental data. The application of this method involves the introduction of an independent parameter “scale of the error probability distribution function” and allows one to synthesize the deviation functions, forming spaces with a nonlinear metric, based on the existing assumptions about the sources of errors and noise. The existing method of regression analysis can be obtained from the considered method as a special case. The article examines examples of analysis of experimental data and shows the high resistance of the method to the appearance of single outliers in the sample under study. Since the introduction of an independent parameter increases the number of computations, for the practical application of the method in measuring and information systems, the architecture of a specialized computing device of the “system on a chip” class and practical approaches to its implementation based on programmable logic integrated circuits are considered.


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