Implementation of Concurrently 6-Readout Integrated Circuit for High Speed Flat Panel X-ray Detector Systems

2007 ◽  
pp. 1513-1516
Author(s):  
Dae Woong Son ◽  
Kyung Jun Yoon ◽  
Sung Ho Cho ◽  
Sang Sik Kang ◽  
Ji Koon Pack ◽  
...  
Keyword(s):  
Integrated Circuit ◽  
High Speed ◽  
Flat Panel ◽  
Readout Integrated Circuit ◽  
X Ray

High-performance low-noise 128-channel readout-integrated circuit for flat-panel x-ray detector systems

2004 ◽  
Author(s):  
Eric J. Beuville ◽  
Mark Belding ◽  
Adrienne N. Costello ◽  
Randy Hansen ◽  
Susan M. Petronio
Keyword(s):  
Integrated Circuit ◽  
High Performance ◽  
Low Noise ◽  
Flat Panel ◽  
Readout Integrated Circuit ◽  
X Ray

Pixel readout IC for CdTe detectors operating in single photon counting mode with interpixel communication

2022 ◽  
Vol 17 (01) ◽  
pp. C01036
Author(s):  
P. Grybos ◽  
R. Kleczek ◽  
P. Kmon ◽  
A. Krzyzanowska ◽  
P. Otfinowski ◽  
...  
Keyword(s):  
Integrated Circuit ◽  
Single Photon ◽  
Photon Counting ◽  
Recognition Algorithm ◽  
Total Charge ◽  
Readout Integrated Circuit ◽  
Single Photon Counting ◽  
X Ray ◽  
Pixel Detectors ◽  
Photon Counting Mode

Abstract This paper presents a readout integrated circuit (IC) of pixel architecture called MPIX (Multithreshold PIXels), designed for CdTe pixel detectors used in X-ray imaging applications. The MPIX IC area is 9.6 mm × 20.3 mm and it is designed in a CMOS 130 nm process. The IC core is a matrix of 96 × 192 square-shaped pixels of 100 µm pitch. Each pixel contains a fast analog front-end followed by four independently working discriminators and four 12-bit ripple counters. Such pixel architecture allows photon processing one by one and selecting the X-ray photons according to their energy (X-ray colour imaging). To fit the different range of applications the MPIX IC has 8 possible different gain settings, and it can process the X-ray photons of energy up to 154 keV. The MPIX chip is bump-bonded to the CdTe 1.5 mm thick pixel sensor with a pixel pitch of 100 µm. To deal with the charge sharing effect coming from a thick semiconductor pixel sensor, multithreshold pattern recognition algorithm is implemented in the readout IC. The implemented algorithm operates both in the analog domain (to recover the total charge spread between neighboring pixels, when a single X-ray photon hits the border of the pixel) and in the digital domain (to allocate a hit position to a single pixel).

A LOW POWER HIGH RESOLUTION ROIC DESIGN WITH 14-BIT COLUMN-LEVEL ADC FOR 384 × 288 IRFPA

2013 ◽  
Vol 22 (09) ◽  
pp. 1340015 ◽  
Author(s):  
YAJING ZHANG ◽  
WENGAO LU ◽  
GUANNAN WANG ◽  
ZHONGJIAN CHEN ◽  
YACONG ZHANG
Keyword(s):  
High Resolution ◽  
Low Power ◽  
Integrated Circuit ◽  
High Speed ◽  
High Performance ◽  
Low Noise ◽  
Cmos Process ◽  
Readout Integrated Circuit ◽  
Analog To Digital Conversion ◽  
Amplifier Design

A readout integrated circuit (ROIC) of infrared focal plane array (IRFPA) with low power and low noise is presented in this paper. It consists of a 384 × 288 pixel array and column-level A/D conversion circuits. The proposed system has high resolution because of the odd–even Analog to Digital Conversion (ADC) structure, containing correlated switches design, multi-Vth amplifier design and high speed high resolution comparator design including latch-stage. Designed and simulated in 0.35-μm CMOS process, this high performance ROIC achieves 81.24 dB SNR at 8.64 KS/s consuming 98 mW under 5 V voltage supply, resulting in an ENOB of 13.2-bit.

Test of 32-Channel X-Ray Readout Integrated Circuit

2013 ◽  
Vol 718-720 ◽  
pp. 1100-1103
Author(s):  
Liu Dan ◽  
Gao Feng ◽  
Jin Chuan
Keyword(s):  
Cross Talk ◽  
Integrated Circuit ◽  
Dynamic Range ◽  
Laser Light ◽  
High Accuracy ◽  
Test Method ◽  
Voltage Source ◽  
Readout Integrated Circuit ◽  
X Ray

The test method of 32 channel X-ray readout integrated circuit (ROIC) has been proposed in this paper. Large resistors and a voltage source with high accuracy are used to generate 32 channels of weak currents, which are injected into the ROIC. Some key parameters of ROIC such as linearity, uniformity, cross talk, dynamic range have been tested. This method helps to test ROICs performance and does not need any photodiode and any laser light, which is convenient and easy to be realized.

scholarly journals A system for time-resolved XRD measurements on hydrogen absorption processes

2014 ◽  
Vol 70 (a1) ◽  
pp. C360-C360
Author(s):  
Akihiko Machida ◽  
Kensuke Higuchi ◽  
Yoshinori Katayama ◽  
Kouji Sakaki ◽  
Hyunjeong Kim ◽  
...  
Keyword(s):  
Hydrogen Absorption ◽  
High Speed ◽  
Video Camera ◽  
Hydrogen Storage Materials ◽  
Sample Cell ◽  
Flat Panel ◽  
Time Resolved ◽  
X Ray ◽  
High Speed Video ◽  
High Speed Video Camera

"To improve performance of hydrogen storage materials, it is essential to understand detailed mechanism of hydrogenation and dehydrogenation reactions. In-situ powder diffraction measurements provide direct information about structural changes accompanying the reactions. We therefore installed a time-resolved x-ray diffraction (XRD) system at a beamline BL22XU at the SPrign-8, a synchrotron radiation facility in Japan. The system was equipped with two area detectors, a flat panel sensor for precise structural analyses and a high speed video camera connected to an x-ray image intensifier for observation of rapid phase changes. Maximum frame rate for the flat panel sensor and high-speed video camera was 2 fps and 125 fps (effective), respectively. A sample cell was connected to a hydrogen supply system. Opening of upstream valve of the sample cell or a change of the pressure at the sample triggered the recording of the diffraction patterns. The pressure of hydrogen gas was limited to 1 MPa. To demonstrate the performance of the system, we have performed time-resolved XRD experiments for LaNi4.5Al0.5. LaNi5 exhibits the significant broadening of the diffraction peaks by hydrogen absorption; however, LaNi4.5Al0.5 shows the no significant broadening. We have succeeded in the measurements of the structural change from the solid solution phase to the hydride phase and have found the formation of the transient intermediate phase on this reaction process. The system is currently used to study several materials. This work was partly supported by New Energy and Industrial Technology Development Organization (NEDO) under ""Advanced Fundamental Research Project on Hydrogen Storage Materials""."

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