Shielding Benchmark Experiments Through Concrete and Iron with High-Energy Proton and Heavy Ion Accelerators

2001 ◽  
pp. 1085-1096
Author(s):  
T. Nakamura ◽  
M. Sasaki ◽  
T. Nunomiya ◽  
N. Nakao ◽  
E. Kim ◽  
...  
Keyword(s):  
Heavy Ion ◽  
High Energy ◽  
High Energy Proton ◽  
Energy Proton

scholarly journals Influence of Orbital Parameters on SEU Rate of Low-Energy Proton in Nano-SRAM Device

Symmetry ◽  
2020 ◽  
Vol 12 (12) ◽  
pp. 2030
Author(s):  
Bing Ye ◽  
Li-Hua Mo ◽  
Tao Liu ◽  
You-Mei Sun ◽  
Jie Liu
Keyword(s):  
Heavy Ion ◽  
High Energy ◽  
Low Energy ◽  
Single Event Upset ◽  
Single Event ◽  
High Energy Proton ◽  
Orbital Parameters ◽  
Energy Proton ◽  
Orbital Height ◽  
Selection Of

The on-orbit single-event upset (SEU) rate of nanodevices is closely related to the orbital parameters. In this paper, the on-orbit SEU rate (OOSR) induced by a heavy ion (HI), high-energy proton (HEP) and low-energy proton (LEP) for a 65 nm SRAM device is calculated by using the software SPACE RADIATION under different orbits based on the experimental data. The results indicate that the OOSR induced by the HI, HEP and LEP varies with the orbital parameters. In particular, the orbital height, inclination and shieling thickness are the key parameters that affect the contribution of the LEP to the total OOSR. Our results provide guidance for the selection of nanodevices on different orbits.

High energy proton emission in heavy ion reactions close to the Fermi energy

2000 ◽  
Vol 471 (4) ◽  
pp. 339-345 ◽  
Author(s):  
R. Coniglione ◽  
P. Sapienza ◽  
E. Migneco ◽  
C. Agodi ◽  
R. Alba ◽  
...  
Keyword(s):  
Fermi Energy ◽  
Heavy Ion ◽  
High Energy ◽  
Proton Emission ◽  
High Energy Proton ◽  
Heavy Ion Reactions ◽  
Energy Proton

High energy proton and heavy ion induced single event transient in 65-nm CMOS technology

2017 ◽  
Vol 60 (12) ◽  
Author(s):  
Jiaqi Liu ◽  
Yuanfu Zhao ◽  
Liang Wang ◽  
Dan Wang ◽  
Hongchao Zheng ◽  
...  
Keyword(s):  
Cmos Technology ◽  
Heavy Ion ◽  
High Energy ◽  
Single Event ◽  
Single Event Transient ◽  
High Energy Proton ◽  
Energy Proton

scholarly journals Effect of Gate Dielectrics on Characteristics of High-Energy Proton-Irradiated AlGaN/GaN MISHEMTs

2021 ◽  
pp. 109473
Author(s):  
Jun-Hyeok Lee ◽  
Dong-Seok Kim ◽  
Jeong-Gil Kim ◽  
Woo-Hyun Ahn ◽  
Youngho Bae ◽  
...  
Keyword(s):  
Gate Dielectrics ◽  
High Energy ◽  
High Energy Proton ◽  
Energy Proton

Absolute calibration of photostimulable image plate detectors used as (0.5–20MeV) high-energy proton detectors

2008 ◽  
Vol 79 (7) ◽  
pp. 073301 ◽  
Author(s):  
A. Mančić ◽  
J. Fuchs ◽  
P. Antici ◽  
S. A. Gaillard ◽  
P. Audebert
Keyword(s):  
High Energy ◽  
Absolute Calibration ◽  
High Energy Proton ◽  
Image Plate ◽  
Energy Proton ◽  
Proton Detectors
Sign in / Sign up

Export Citation Format

Share Document