A possible route to the quantification of piezoresponse force microscopy through correlation with electron backscatter diffraction

2011 ◽  
pp. 95-105
Author(s):  
T. L. Burnett ◽  
P. M. Weaver ◽  
J. F. Blackburn ◽  
M. Stewart ◽  
M. G. Cain
Keyword(s):  
Electron Backscatter Diffraction ◽  
Piezoresponse Force Microscopy ◽  
Force Microscopy ◽  
Electron Backscatter ◽  
Backscatter Diffraction

Grain size quantification by optical microscopy, electron backscatter diffraction, and magnetic force microscopy

Micron ◽  
2017 ◽  
Vol 101 ◽  
pp. 41-47 ◽  
Author(s):  
Hansheng Chen ◽  
Yin Yao ◽  
Jacob A Warner ◽  
Jiangtao Qu ◽  
Fan Yun ◽  
...  
Keyword(s):  
Grain Size ◽  
Optical Microscopy ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Electron Backscatter Diffraction ◽  
Force Microscopy ◽  
Electron Backscatter ◽  
Backscatter Diffraction

Electron-Backscatter Diffraction of Photovoltaic Thin Films

2007 ◽  
Vol 1012 ◽  
Author(s):  
Helio Moutinho ◽  
Ramesh Dhere ◽  
Chun-Sheng Jiang ◽  
Bobby To ◽  
Mowafak Al-Jassim
Keyword(s):  
Electron Backscatter Diffraction ◽  
Ion Beam ◽  
Surface Damage ◽  
Sample Surface ◽  
Force Microscopy ◽  
Atomic Force ◽  
Ebsd Data ◽  
Electron Backscatter ◽  
Backscatter Diffraction

AbstractIn electron-backscatter diffraction, crystalline orientation maps are formed while the electron beam of an SEM scans the sample surface. EBSD requires a flat sample to avoid shadowing of the electrons from the detector by surface features. In this work, we investigate the preparation of CdTe samples deposited by close-spaced sublimation for EBSD analysis. Untreated samples were rough, resulting in areas with no EBSD signal. We processed the samples by polishing and ion-beam milling. Polishing produced flat samples, but low-quality EBDS data, because the top surface of the samples had poor crystallinity. In contrast, ion-beam milling proved to be suitable for producing flat samples with minimal surface damage, yielding good EBSD data. We also analyzed the samples with atomic force microscopy, and correlated the quality of the EBSD data with sample roughness. The EBSD data showed that the CdTe films were randomly oriented and had columnar growth and a high density of <111> twin boundaries.

scholarly journals Misorientations in [001] magnetite thin films studied by electron backscatter diffraction and magnetic force microscopy

2007 ◽  
Vol 101 (9) ◽  
pp. 09M507 ◽  
Author(s):  
A. Koblischka-Veneva ◽  
M. R. Koblischka ◽  
J. D. Wei ◽  
Y. Zhou ◽  
S. Murphy ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Electron Backscatter Diffraction ◽  
Force Microscopy ◽  
Electron Backscatter ◽  
Backscatter Diffraction
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