A New Estimation Procedure for the Three-Parameter Lognormal Distribution

1981 ◽  
pp. 133-140 ◽  
Author(s):  
Mario Chieppa ◽  
Pancrazio Amato
Keyword(s):  
Lognormal Distribution ◽  
Estimation Procedure

THE REALIZATION OF THE ITERATIVE METHOD OF THE LEAST SQUARES FOR THE ESTIMATION OF STATIC OBJECT PARAMETERS IN MATLAB ENVIRONMENT

2017 ◽  
pp. 28-36
Author(s):  
Galina Vasil’evna Troshina ◽  
Alexander Aleksandrovich Voevoda
Keyword(s):  
Parameter Estimation ◽  
Iterative Method ◽  
Least Squares ◽  
Input Signal ◽  
Layer Structure ◽  
Estimation Procedure ◽  
Parameter Estimation Procedure ◽  
Noise Simulation ◽  
Static Object ◽  
Object Parameters

It was suggested to use the system model working in real time for an iterative method of the parameter estimation. It gives the chance to select a suitable input signal, and also to carry out the setup of the object parameters. The object modeling for a case when the system isn't affected by the measurement noises, and also for a case when an object is under the gaussian noise was executed in the MatLab environment. The superposition of two meanders with different periods and single amplitude is used as an input signal. The model represents the three-layer structure in the MatLab environment. On the most upper layer there are units corresponding to the simulation of an input signal, directly the object, the unit of the noise simulation and the unit for the parameter estimation. The second and the third layers correspond to the simulation of the iterative method of the least squares. The diagrams of the input and the output signals in the absence of noise and in the presence of noise are shown. The results of parameter estimation of a static object are given. According to the results of modeling, the algorithm works well even in the presence of significant measurement noise. To verify the correctness of the work of an algorithm the auxiliary computations have been performed and the diagrams of the gain behavior amount which is used in the parameter estimation procedure have been constructed. The entry conditions which are necessary for the work of an iterative method of the least squares are specified. The understanding of this algorithm functioning principles is a basis for its subsequent use for the parameter estimation of the multi-channel dynamic objects.

Model-based control of the substrate concentration in an aeration basin using the wastewater level

1998 ◽  
Vol 37 (12) ◽  
pp. 335-342 ◽  
Author(s):  
Jacek Czeczot
Keyword(s):  
Substrate Concentration ◽  
Consumption Rate ◽  
Least Square Method ◽  
Estimation Procedure ◽  
Adaptive Controller ◽  
Open Loop ◽  
Least Square ◽  
Substrate Consumption ◽  
Model Based ◽  
Effluent Flow Rate

This paper deals with the minimal-cost control of the modified activated sludge process with varying level of wastewater in the aerator tank. The model-based adaptive controller of the effluent substrate concentration, basing on the substrate consumption rate and manipulating the effluent flow rate outcoming from the aerator tank, is proposed and its performance is compared with conventional PI controller and open loop behavior. Since the substrate consumption rate is not measurable on-line, the estimation procedure on the basis of the least-square method is suggested. Finally, it is proved that cooperation of the DO concentration controller with the adaptive controller of the effluent substrate concentration allows the process to be operated at minimum costs (low consumption of aeration energy).

DEVELOPMENT OF RELIABILITY PROJECT ESTIMATION PROCEDURE CONSIDERING EFFECTS OF IONIZING RADIATION FOR ELECTRONIC EQUIPMENT

2019 ◽  
pp. 57-63
Author(s):  
M. A. Artyukhova ◽  
S. N. Polesskiy
Keyword(s):  
Ionizing Radiation ◽  
Radiation Resistance ◽  
Power Plants ◽  
Estimation Procedure ◽  
Reliability Estimation ◽  
Electronic Equipment ◽  
Design Stage ◽  
Space Systems ◽  
Reliability Indicators ◽  
Project Estimation

Human activity is often accompanied by exposure of ionizing radiation: the exploitation of space systems and power plants, research using isotopic sources, medicine. The development of electronic equipment is regulated by carrying out activities to ensure the required reliability and radiation resistance. However, the effect of ionizing radiation on reliability indicators is not taken into account properly, or is not taken into account at all, that sometimes leads to the loss of expensive equipment and even to human victims. The article discusses the methodology for carrying out an adequate estimate of the reliability considering the influence of external influencing factors, including ionizing radiation. The timeliness of decisions making to ensure the required reliability indicators is determined by the completeness of the reliability estimation at the design stage. Effort to ensure the reliability and durability of devices after the design stage is not economically viable. The completeness and adequacy of the estimation always depends on the interaction of specialists in different fields: designers, programmers, experts in the field of circuit design, electrical engineering and experts in the field of reliability and radiation resistance.

scholarly journals Application of Scattering Parameters to DPL Time-Lag Parameter Estimation at Nanoscale in Modern Integration Circuit Structures

Energies ◽  
2021 ◽  
Vol 14 (15) ◽  
pp. 4425
Author(s):  
Mariusz Zubert ◽  
Zbigniew Kulesza ◽  
Mariusz Jankowski ◽  
Andrzej Napieralski
Keyword(s):  
Integrated Circuits ◽  
Time Lag ◽  
Estimation Procedure ◽  
Micro Electro Mechanical System ◽  
Hafnium Dioxide ◽  
Parameters Estimation ◽  
Phase Lag ◽  
Scattering Parameters ◽  
Materials Used ◽  
Temperature Time

This paper presents the methodology of material parameters’ estimation for the dual-phase-lag (DPL) model at the nanoscale in modern integration circuit (IC) structures. The analyses and measurements performed were used in the unique dedicated micro-electro-mechanical system (MEMS) test structure. The electric and thermal domain of this structure was analysed. Finally, the silicon dioxide (SiO2) temperature time-lag estimation procedure is presented based on the scattering parameters measured by a vector network analyser for the considered MEMS structure together with the 2-omega method. The proposed methodology has the ability to estimate the time-lag parameter with high accuracy and is also suitable for the temperature time-lag estimation for other manufacturing process technologies of ICs and other insulation materials used for integrated circuits such as silicon nitride (Si3N4), titanium nitride (TiN), and hafnium dioxide (HfO2).

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