A Novel Method to Detect Program Malfunctioning on Embedded Devices Using Run-Time Trace
2009 ◽
Vol 18
(01)
◽
pp. 81-95
2016 ◽
Vol 27
(22)
◽
pp. 3601-3615
◽
Keyword(s):
2001 ◽
Vol 31
(2)
◽
pp. 129-146
◽
1995 ◽
Vol 53
◽
pp. 1020-1021
1997 ◽
Vol 71-72
(1-3)
◽
pp. 403-425
◽
2020 ◽
Keyword(s):
1878 ◽
Vol 5
(109supp)
◽
pp. 1725-1726