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Recent Advances in PMOS Negative Bias Temperature Instability
Mapping Intimacies
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10.1007/978-981-16-6120-4
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2022
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Keyword(s):
Negative Bias
◽
Negative Bias Temperature Instability
◽
Temperature Instability
◽
Bias Temperature Instability
◽
Recent Advances
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Related Documents
Cited By
References
New Multi-stages – Hydrogen Diffusion Model for Negative Bias Temperature Instability
Journal of Nano- and Electronic Physics
◽
10.21272/jnep.11(4).04018
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2019
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Vol 11
(4)
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pp. 04018-1-04018-6
Author(s):
M. Mallati
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◽
H. Bentarzi
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Keyword(s):
Diffusion Model
◽
Hydrogen Diffusion
◽
Negative Bias
◽
Negative Bias Temperature Instability
◽
Temperature Instability
◽
Bias Temperature Instability
Download Full-text
Defect Creation Stimulated by Thermally Activated Hole Trapping as the Driving Force Behind Negative Bias Temperature Instability in SiO2, SiON, and High-k Gate Stacks
2008 IEEE International Integrated Reliability Workshop Final Report
◽
10.1109/irws.2008.4796094
◽
2008
◽
Cited By ~ 7
Author(s):
Tibor Grasser
◽
Ben Kaczer
◽
Thomas Aichinger
◽
Wolfgang Goes
◽
Michael Nelhiebel
Keyword(s):
Driving Force
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Negative Bias
◽
Gate Stacks
◽
Negative Bias Temperature Instability
◽
Temperature Instability
◽
Thermally Activated
◽
Bias Temperature Instability
◽
Hole Trapping
◽
High K
◽
Defect Creation
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A novel Negative Bias Temperature Instability model for nanoscale Finfet
2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits
◽
10.1109/ipfa.2009.5232688
◽
2009
◽
Author(s):
Chenyue Ma
◽
Bo Li
◽
Frank He
◽
Xing Zhang
◽
Xinnan Lin
Keyword(s):
Negative Bias
◽
Negative Bias Temperature Instability
◽
Temperature Instability
◽
Bias Temperature Instability
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Spin dependent recombination study of the atomic-scale effects of fluorine on the negative bias temperature instability
2009 IEEE International Reliability Physics Symposium
◽
10.1109/irps.2009.5173396
◽
2009
◽
Cited By ~ 2
Author(s):
J.T. Ryan
◽
P.M. Lenahan
◽
A.T. Krishnan
◽
S. Krishnan
◽
J.P. Campbell
Keyword(s):
Scale Effects
◽
Atomic Scale
◽
Negative Bias
◽
Negative Bias Temperature Instability
◽
Temperature Instability
◽
Bias Temperature Instability
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Mechanism and process dependence of negative bias temperature instability (NBTI) for pMOSFETs with ultrathin gate dielectrics
International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224)
◽
10.1109/iedm.2001.979649
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2002
◽
Cited By ~ 22
Author(s):
C.H. Liu
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M.T. Lee
◽
Chih-Yung Lin
◽
J. Chen
◽
K. Schruefer
◽
...
Keyword(s):
Gate Dielectrics
◽
Negative Bias
◽
Negative Bias Temperature Instability
◽
Temperature Instability
◽
Bias Temperature Instability
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The Impact of Nitrogen Engineering in Silicon Oxynitride Gate Dielectric on Negative-Bias Temperature Instability of p-MOSFETs: A Study by Ultrafast On-The-Fly $I_{\rm DLIN}$ Technique
IEEE Transactions on Electron Devices
◽
10.1109/ted.2008.923524
◽
2008
◽
Vol 55
(7)
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pp. 1630-1638
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Cited By ~ 39
Author(s):
Vrajesh D. Maheta
◽
Christopher Olsen
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Khaled Ahmed
◽
Souvik Mahapatra
Keyword(s):
Gate Dielectric
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Silicon Oxynitride
◽
Negative Bias
◽
Negative Bias Temperature Instability
◽
Temperature Instability
◽
Bias Temperature Instability
◽
The Impact
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Impact of negative bias temperature instability on digital circuit reliability
2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320)
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10.1109/relphy.2002.996644
◽
2003
◽
Cited By ~ 102
Author(s):
V. Reddy
◽
A.T. Krishnan
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A. Marshall
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J. Rodriguez
◽
S. Natarajan
◽
...
Keyword(s):
Digital Circuit
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Negative Bias
◽
Circuit Reliability
◽
Negative Bias Temperature Instability
◽
Temperature Instability
◽
Bias Temperature Instability
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Impact of substrate bias on p-MOSFET negative bias temperature instability
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual.
◽
10.1109/relphy.2005.1493212
◽
2005
◽
Cited By ~ 2
Author(s):
P.B. Kurnars
◽
T.R. Dalei
◽
D. Varghese
◽
D. Saba
◽
S. Mahapatra
◽
...
Keyword(s):
Negative Bias
◽
Substrate Bias
◽
Negative Bias Temperature Instability
◽
Temperature Instability
◽
Bias Temperature Instability
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Dispersive Transport and Negative Bias Temperature Instability: Boundary Conditions, Initial Conditions, and Transport Models
IEEE Transactions on Device and Materials Reliability
◽
10.1109/tdmr.2007.912779
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2008
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Vol 8
(1)
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pp. 79-97
◽
Cited By ~ 37
Author(s):
T. Grasser
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W. Gos
◽
B. Kaczer
Keyword(s):
Boundary Conditions
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Initial Conditions
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Negative Bias
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Dispersive Transport
◽
Negative Bias Temperature Instability
◽
Transport Models
◽
Temperature Instability
◽
Bias Temperature Instability
◽
Instability Boundary
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A Model for Negative Bias Temperature Instability in Oxide and High κ pFETs
2007 IEEE International Conference on Integrated Circuit Design and Technology
◽
10.1109/icicdt.2007.4299550
◽
2007
◽
Cited By ~ 4
Author(s):
S. Zafar
Keyword(s):
Negative Bias
◽
Negative Bias Temperature Instability
◽
Temperature Instability
◽
Bias Temperature Instability
Download Full-text
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