Minimizing the thickness of an inhomogeneous layer at a given reflection coefficient for a monochromatic wave

1972 ◽  
Vol 10 (1) ◽  
pp. 40-47
Author(s):  
K. A. Lur'e ◽  
M. M. Machevariani
Keyword(s):  
Reflection Coefficient ◽  
Inhomogeneous Layer ◽  
Monochromatic Wave

scholarly journals Инварианты коэффициента отражения

2020 ◽  
Vol 128 (2) ◽  
pp. 266
Author(s):  
Л.А. Федюхин ◽  
А.В. Горчаков ◽  
Е.А. Колосовский
Keyword(s):  
Dielectric Constant ◽  
Reflection Coefficient ◽  
Parallel Plate ◽  
Layer Structure ◽  
Direct Calculation ◽  
Reflection Factor ◽  
Monochromatic Wave ◽  
Material Parameters ◽  
Linearly Polarized ◽  
Analytical Expressions

A detailed analysis of the reflection coefficient of linearly polarized in plane of incidence of a plane monochromatic wave from a three-layer structure is carried out. Solved the reverse problem ellipsometry for a three-layer structure. The existence of two reflection factor invariants for the flat-parallel plate is shown. A set of three observable parameters not previously used is proposed, which allows to restore the material parameters of the layer. Analytical expressions are obtained both for the reflection coefficient and incidence angles for a number of important particular cases, and for the direct calculation of the dielectric constant and layer thickness from the measured values of the observed parameters.

scholarly journals Антиклассическое приближение в задаче об отражении электромагнитной волны от неоднородной среды

2022 ◽  
Vol 92 (1) ◽  
pp. 5
Author(s):  
В.В. Шагаев
Keyword(s):  
Perturbation Theory ◽  
Reflection Coefficient ◽  
Analytical Solution ◽  
Numerical Solution ◽  
Layer Thickness ◽  
Electromagnetic Waves ◽  
Dielectric Medium ◽  
Quadratic Approximation ◽  
Reflection Coefficients ◽  
Inhomogeneous Layer

Expressions are derived for the reflection coefficients of electromagnetic waves with "p" and "s" type polarizations from a semi-infinite dielectric medium having an inhomogeneous layer. The influence of the layer was taken into account by the method of perturbation theory in a quadratic approximation of the layer thickness. A method is proposed for converting expressions derived using perturbation theory into other expressions that give more accurate values of the reflection coefficient. The angular dependences of the reflection coefficient obtained by the developed method are compared with those obtained by the numerical solution of electrodynamic equations. Requirements for the layer characteristics are formulated to minimize the error of the analytical solution.

The method of determining the metrological performance of unit reference standards of reflection coefficient in waveguides at millimeter waves

2020 ◽  
pp. 59-63
Author(s):  
A.S. Bondarenko ◽  
A.S. Borovkov ◽  
I.M. Malay ◽  
V.A. Semyonov
Keyword(s):  
Reflection Coefficient ◽  
Millimeter Waves ◽  
Primary Standard ◽  
Reference Standards ◽  
Measurement Scale ◽  
Current State ◽  
Coefficient Measurement ◽  
Mathematical Equations ◽  
Electrodynamic Modeling ◽  
Metrological Performance

The analysis of the current state of the reflection coefficient measurements in waveguides at millimeter waves is carried out. An approach for solving the problem of reproducing the reflection coefficient measurement scale is proposed. Mathematical equations, which are the basis of the reflection coefficient measurement equation are obtained. The method of determining the metrological performance of reflection coefficient unit’s reference standards is developed. The results of electrodynamic modeling and analytical calculations by the developed method are compared. It is shown that this method can be used for reproducing the reflection coefficient unit in the development of the State primary standard.

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