On the simultaneous diffraction of X-rays in double crystal spectrometry

1972 ◽  
Vol 22 (5) ◽  
pp. 427-428 ◽  
Author(s):  
J. Hrdý ◽  
E. Krouský
Keyword(s):  
X Rays ◽  
1996 ◽  
Vol 67 (9) ◽  
pp. 3348-3348
Author(s):  
D.M. Mills ◽  
W.K. Lee ◽  
M. Keeffe ◽  
D.R. Haeffner ◽  
P. Fernandez

1992 ◽  
Vol 10 (4) ◽  
pp. 841-847 ◽  
Author(s):  
O. Renner ◽  
M. Kopecký

Vertical dispersion variant of the double-crystal spectrograph is analyzed and its basic quantitative characteristics (luminosity, resolving power) are computed using ray tracing code. It is shown that geometric apparatus smearing is minimized due to high dispersion and spectral resolution may considerably exceed the single-crystal diffraction limit. Performing high-resolution spectral work, the efficiency of the double-crystal apparatus exceeds that of the flat single-crystal spectrograph. The usefulness of this method in laser plasma spectroscopy is demonstrated analyzing the detection of phosphorus He-like resonance line and its satellites.


1998 ◽  
Vol 5 (3) ◽  
pp. 679-681 ◽  
Author(s):  
Yasuharu Kashihara ◽  
Hiroshi Yamazaki ◽  
Kenji Tamasaku ◽  
Tetsuya Ishikawa

The rotated-inclined double-crystal monochromator (RIDCM) has been adopted to reduce the heat load from third-generation undulator radiation. The position of the exit X-rays from RIDCM has been calculated as a function of X-ray energy on the basis of diffraction theory including refraction effects. The results show that the positions of the exit X-rays vary over a wide range due to asymmetric reflection. Methods of fixing the exit position in RIDCM are also discussed.


1930 ◽  
Vol 36 (5) ◽  
pp. 791-798 ◽  
Author(s):  
J. A. Bearden
Keyword(s):  
X Rays ◽  

1988 ◽  
Vol 27 (Part 1, No. 5) ◽  
pp. 849-854
Author(s):  
Michio Niwano ◽  
Akira Kanai ◽  
Maki Suemitsu ◽  
Hirofumi Nakamura ◽  
Nobuo Miyamoto
Keyword(s):  
X Rays ◽  

2004 ◽  
Vol 37 (1) ◽  
pp. 48-51 ◽  
Author(s):  
Hiroshi Yamazaki ◽  
Tetsuya Ishikawa

X-ray rocking-curve profiles for a perfect crystal are calculated using the mutual coherence function of the incident wave. The derived result is that the rocking curve to be measured should be a convolution of the intrinsic profile of the crystal reflection with the Fourier transform of the complex degree of coherence of the incident wave. This allows experimental evaluation of the complex degree of coherence from measured rocking-curve profiles with the help of the calculated intrinsic profile. The mutual coherence function of synchrotron X-rays prepared with a conventional Si double-crystal monochromator was mapped as a function of both spatial separation and time delay.


2016 ◽  
Vol 23 (5) ◽  
pp. 1245-1253 ◽  
Author(s):  
Chris Nicklin ◽  
Tom Arnold ◽  
Jonathan Rawle ◽  
Adam Warne

Beamline I07 at Diamond Light Source is dedicated to the study of the structure of surfaces and interfaces for a wide range of sample types, from soft matter to ultrahigh vacuum. The beamline operates in the energy range 8–30 keV and has two endstations. The first houses a 2+3 diffractometer, which acts as a versatile platform for grazing-incidence techniques including surface X-ray diffraction, grazing-incidence small- (and wide-) angle X-ray scattering, X-ray reflectivity and grazing-incidence X-ray diffraction. A method for deflecting the X-rays (a double-crystal deflector) has been designed and incorporated into this endstation, extending the surfaces that can be studied to include structures formed on liquid surfaces or at liquid–liquid interfaces. The second experimental hutch contains a similar diffractometer with a large environmental chamber mounted on it, dedicated toin situultrahigh-vacuum studies. It houses a range of complementary surface science equipment including a scanning tunnelling microscope, low-energy electron diffraction and X-ray photoelectron spectroscopy ensuring that correlations between the different techniques can be performed on the same sample, in the same chamber. This endstation allows accurate determination of well ordered structures, measurement of growth behaviour during molecular beam epitaxy and has also been used to measure coherent X-ray diffraction from nanoparticles during alloying.


1988 ◽  
Vol 32 ◽  
pp. 141-147
Author(s):  
Shinjiro Hayakawa ◽  
Atsuo Iida ◽  
Sadao Aoki ◽  
Yohichi Gohshi

AbstractA synchrotron radiation X-ray micro analyzer(SRXMA) was developed at Photon Factory in Japan. The present SRXMA combines a double crystal monochromator and mirror optics and either a white or a monochromatic microbeam can be used. Micro X-ray fluorescence analysis was carried out, and a minimum detection limit of 1 ppm for Mn was obtained for 100 sec measurement with the white beam. With monochromatic beam excitation, micro X-ray spectroscopies are now feasible.The obtained beam size was 1.6 μ;m - 34 μm* The beam was blurred in one direction by the scattered X-rays caused by the surface irregularities of the focusing mirror. Improvements in the mirror quality will ensure a beam spot of just a few microns with sufficient intensity.


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