Nonaxisymmetric vibrations of radially polarized hollow cylinders made of functionally gradient piezoelectric materials

In the present paper, two kinds of thick-walled hollow cylinders are studied. One is the cylinder with multi-layers and another is functionally graded cylinder. Both the cylinders are made of piezoelectric materials. Based on the basic piezoelectric equations, the exact solutions for the elastic hollow cylinder with N-layers submitted to external voltage are obtained. For the graded hollow cylinder the exact solutions are obtained by using displacement method and three hypergeometric functions. Comparisons demonstrate that the limitation of the multilayer cases is consistent with that of graded cases.

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Nonaxisymmetric Waves in Layered Hollow Cylinders with Radially Polarized Piezoceramic Layers

International Applied Mechanics ◽

10.1007/s10778-013-0597-3 ◽

2013 ◽

Vol 49 (6) ◽

pp. 641-649 ◽

Cited By ~ 7

Author(s):

A. Ya. Grigorenko ◽

I. A. Loza

Keyword(s):

Hollow Cylinders ◽

Radially Polarized ◽

Layered Hollow Cylinders

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Radially polarized functionally graded piezoelectric hollow cylinders as sensors and actuators

European Journal of Mechanics - A/Solids ◽

10.1016/j.euromechsol.2010.02.003 ◽

2010 ◽

Vol 29 (4) ◽

pp. 704-713 ◽

Cited By ~ 26

Author(s):

Xian-Fang Li ◽

Xu-Long Peng ◽

Kang Yong Lee

Keyword(s):

Functionally Graded ◽

Sensors And Actuators ◽

Hollow Cylinders ◽

Functionally Graded Piezoelectric ◽

Radially Polarized

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Analysis of Sputtered Zinc Oxide Films

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s1431927600001781 ◽

1980 ◽

Vol 38 ◽

pp. 416-417

Author(s):

T. A. Emma ◽

M. P. Singh

Keyword(s):

Electron Microscopy ◽

Zinc Oxide ◽

Piezoelectric Materials ◽

Oxide Films ◽

Optical Quality ◽

Zno Films ◽

Rf Power ◽

X Ray Diffraction ◽

Sputtered Films ◽

Zinc Oxide Films

Optical quality zinc oxide films have been characterized using reflection electron diffraction (RED), replication electron microscopy (REM), scanning electron microscopy (SEM), and X-ray diffraction (XRD). Significant microstructural differences were observed between rf sputtered films and planar magnetron rf sputtered films. Piezoelectric materials have been attractive for applications to integrated optics since they provide an active medium for signal processing. Among the desirable physical characteristics of sputtered ZnO films used for this and related applications are a highly preferred crystallographic texture and relatively smooth surfaces. It has been found that these characteristics are very sensitive to the type and condition of the substrate and to the several sputtering parameters: target, rf power, gas composition and substrate temperature.

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