The non-destructive determination of REE in fossilized bone using synchrotron radiation induced K-line X-ray microfluorescence analysis

Summary The possibility of using synchrotron radiation microbeam X-ray fluorescence (μ -XRF) for the determination of the morphological distribution of inorganic elements in wood has been investigated. A number of samples were analyzed and some of the results are presented in this paper. The new application of the method showed good results and it was concluded that the technique is useful for specific in situ metal ion analysis of wood. One of its special advantages is that it is a non-destructive method, which may allow analysis of the same sample before and after a chemical treatment. This study shows the natural distribution of a selection of metal ions in wood. Some differences in the distribution and amount of certain metals could also be observed in a sample that had been subjected to treatment with an EDTA-solution.

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Determination of trace elements in aluminium with synchrotron radiation-induced x-ray fluorescence

X-Ray Spectrometry ◽

10.1002/xrs.1300200609 ◽

1991 ◽

Vol 20 (6) ◽

pp. 293-295 ◽

Cited By ~ 10

Author(s):

P. Chevallier ◽

K. Abbas ◽

P. Sainfort

Keyword(s):

Trace Elements ◽

Synchrotron Radiation ◽

X Ray ◽

Radiation Induced

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Direct Determination of Cadmium Speciation in Municipal Solid Waste Fly Ashes by Synchrotron Radiation Induced μ-X-ray Fluorescence and μ-X-ray Absorption Spectroscopy

Environmental Science & Technology ◽

10.1021/es010261o ◽

2002 ◽

Vol 36 (14) ◽

pp. 3165-3169 ◽

Cited By ~ 29

Author(s):

Andrea Somogyi ◽

Alexandre S. Simionovici ◽

Stuart Ansell ◽

Britt-Marie Steenari ◽

Oliver Lindqvist

Keyword(s):

Synchrotron Radiation ◽

Municipal Solid Waste ◽

Solid Waste ◽

Direct Determination ◽

Fly Ashes ◽

X Ray ◽

Cadmium Speciation ◽

Radiation Induced ◽

X Ray Absorption

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Stoichiometric Determination of Graphite Intercalation Compounds Using Rutherford Backscatiering Spectrometry

MRS Proceedings ◽

10.1557/proc-27-481 ◽

1983 ◽

Vol 27 ◽

Author(s):

L. Salamanca-Riba ◽

B.S. Elman ◽

M.S. Dresselhaus ◽

T. Venkatesan

Keyword(s):

Experimental Error ◽

Rutherford Backscattering Spectrometry ◽

Rutherford Backscattering ◽

Intercalation Compounds ◽

Graphite Intercalation Compounds ◽

X Ray ◽

Donor And Acceptor ◽

Graphite Intercalation ◽

Non Destructive

ABSTRACTRutherford backscattering spectrometry (RBS) is used to characterize the stoichiometry of graphite intercalation compounds (GIC). Specific application is made to several stages of different donor and acceptor compounds and to commensurate and incommensurate intercalants. A deviation from the theoretical stoichiometry is measured for most of the compounds using this non-destructive method. Within experimental error, the RBS results agree with those obtained from analysis of the (00ℓ) x-ray diffractograms and weight uptake measurements on the same samples.

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X‐ray determination of the Debye temperature at high pressure using high‐energy synchrotron radiation

Journal of Applied Physics ◽

10.1063/1.346446 ◽

1990 ◽

Vol 68 (6) ◽

pp. 2719-2722 ◽

Cited By ~ 2

Author(s):

A. Matsumuro ◽

M. Kobayashi ◽

T. Kikegawa ◽

M. Senoo

Keyword(s):

High Pressure ◽

Synchrotron Radiation ◽

Debye Temperature ◽

High Energy ◽

X Ray

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Update On Synchrotron Radiation TXRF: New Results

MRS Proceedings ◽

10.1557/proc-524-245 ◽

1998 ◽

Vol 524 ◽

Cited By ~ 1

Author(s):

S. Brennan ◽

P. Pianetta ◽

S. Ghosh ◽

N. Takaura ◽

C. Wiemer ◽

...

Keyword(s):

Synchrotron Radiation ◽

Total Reflection ◽

Synchrotron Source ◽

X Ray ◽

Non Destructive

ABSTRACTSynchrotron-based total-reflection x-ray fluorescence(SR-TXRF) has been developed as a leading technique for measuring wafer cleanliness. It holds advantages over other techniques in that it is non-destructive and allows mapping of the surface. The highest sensitivity observed thus far is 3x108 atoms/cm 2 (- 3fg) for 1000 second count time. Several applications of SR-TXRF are presented which take advantage of the energy tunability of the synchrotron source or the mapping capability.

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