Efficient Pattern Generation for Small-Delay Defects Using Selection of Critical Faults
2013 ◽
Vol 29
(1)
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pp. 35-48
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2017 ◽
pp. 147-160
Keyword(s):
2017 ◽
pp. 161-182
Keyword(s):
2011 ◽
pp. 21-36
◽
Keyword(s):
Keyword(s):
Keyword(s):
2011 ◽
Vol 28
(2)
◽
pp. 52-61
◽