Ag/HfO2-based conductive bridge memories elaborated by atomic layer deposition: impact of inert electrode and HfO2 crystallinity on resistive switching mechanisms
2020 ◽
Vol 31
(16)
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pp. 13487-13495
Keyword(s):
2017 ◽
Vol 56
(5)
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pp. 050304
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2020 ◽
Vol 38
(3)
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pp. 032405
Keyword(s):
Improvement of Resistive Switching Stability of HfO2 Films with Al Doping by Atomic Layer Deposition
2012 ◽
Vol 15
(4)
◽
pp. H88
◽
Keyword(s):