Ag/HfO2-based conductive bridge memories elaborated by atomic layer deposition: impact of inert electrode and HfO2 crystallinity on resistive switching mechanisms

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P. Gonon ◽  
C. Vallée ◽  
F. Jomni ◽  
E. Jalaguier ◽  
...  
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Jue Yu ◽  
Wei Huang ◽  
Chao Lu ◽  
Guangyang Lin ◽  
Cheng Li ◽  
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Ching-Shiang Peng ◽  
Wen-Yuan Chang ◽  
Yi-Hsuan Lee ◽  
Ming-Ho Lin ◽  
Frederick Chen ◽  
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Hui Yang ◽  
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RSC Advances ◽  
2017 ◽  
Vol 7 (27) ◽  
pp. 16704-16708 ◽  
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Masoud Akbari ◽  
Min-Kyu Kim ◽  
Dongshin Kim ◽  
Jang-Sik Lee

The resistive switching behaviors of AlOX/HfOX bilayer structures were investigated.


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