scholarly journals Electron Backscatter Diffraction Analysis of the Microstructure Fineness in Pure Copper Under Torsional Deformation

2018 ◽  
Vol 50 (1) ◽  
pp. 92-97 ◽  
Author(s):  
C. P. Wang ◽  
J. K. Fan ◽  
F. G. Li ◽  
J. C. Liu
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