In Situ Study of Low-Temperature Irradiation-Induced Defects in Silicon Carbide

2019 ◽  
Vol 48 (6) ◽  
pp. 3849-3853
Author(s):  
S. M. Tunhuma ◽  
F. D. Auret ◽  
H. T. Danga ◽  
J. M. Nel ◽  
M. M. Diale
Keyword(s):  
Silicon Carbide ◽  
Low Temperature ◽  
In Situ Study ◽  
Temperature Irradiation ◽  
Induced Defects ◽  
Irradiation Induced Defects

Low-temperature irradiation-induced defects inp-type germanium

2010 ◽  
Vol 81 (3) ◽  
Author(s):  
Vl. Kolkovsky ◽  
M. Christian Petersen ◽  
A. Mesli ◽  
A. Nylandsted Larsen
Keyword(s):  
Low Temperature ◽  
Temperature Irradiation ◽  
Induced Defects ◽  
Irradiation Induced Defects

Low-temperature irradiation-induced defects in germanium:In situanalysis

2008 ◽  
Vol 78 (16) ◽  
Author(s):  
A. Mesli ◽  
L. Dobaczewski ◽  
K. Bonde Nielsen ◽  
Vl. Kolkovsky ◽  
M. Christian Petersen ◽  
...  
Keyword(s):  
Low Temperature ◽  
Temperature Irradiation ◽  
Induced Defects ◽  
Irradiation Induced Defects

Low temperature annealing of electron irradiation induced defects in 4H-SiC

2004 ◽  
Vol 85 (17) ◽  
pp. 3780-3782 ◽  
Author(s):  
Antonio Castaldini ◽  
Anna Cavallini ◽  
Lorenzo Rigutti ◽  
Filippo Nava
Keyword(s):  
Low Temperature ◽  
Electron Irradiation ◽  
Low Temperature Annealing ◽  
Induced Defects ◽  
Irradiation Induced Defects

Low-temperature joining of silicon carbide via Al-air in situ reaction

2019 ◽  
Vol 45 (18) ◽  
pp. 24932-24935
Author(s):  
Jia-Xiang Xue ◽  
Rui Shu ◽  
Ye-Hong Liao ◽  
Jian-Han Zhai ◽  
Hai-Bin Ma ◽  
...  
Keyword(s):  
Silicon Carbide ◽  
Low Temperature ◽  
In Situ Reaction

Low temperature anneal of electron irradiation induced defects in p type silicon

1998 ◽  
Vol 14 (12) ◽  
pp. 1295-1298 ◽  
Author(s):  
M.-A. Trauwaert ◽  
J. Vanhellemont ◽  
H. E. Maes ◽  
A.-M. Van Bavel ◽  
G. Langouche
Keyword(s):  
Low Temperature ◽  
Electron Irradiation ◽  
Type Silicon ◽  
P Type ◽  
Induced Defects ◽  
Irradiation Induced Defects

In-situ study on thermal decomposition of 1,3-disilabutane to silicon carbide on Si(100) surface

2012 ◽  
Vol 258 (6) ◽  
pp. 2201-2205
Author(s):  
Hae-geun Jee ◽  
Sang-Hun Nam ◽  
Jin-Hyo Boo ◽  
Seong Kyu Kim ◽  
Soon-Bo Lee
Keyword(s):  
Thermal Decomposition ◽  
Silicon Carbide ◽  
In Situ Study
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