The Combination of Electron Backscatter Diffraction and Focus Ion Beam Microscopy to Determine Three-Dimensional Grain Orientation

2013 ◽  
Vol 13 (3) ◽  
pp. 377-380
Author(s):  
William M. Kane
Keyword(s):  
Grain Orientation ◽  
Electron Backscatter Diffraction ◽  
Ion Beam ◽  
Three Dimensional ◽  
Electron Backscatter ◽  
Focus Ion Beam ◽  
Backscatter Diffraction

The Combination of Electron Backscatter Diffraction and Focus Ion Beam Microscopy to Determine Three-Dimensional Grain Orientation

2012 ◽  
Vol 18 (S2) ◽  
pp. 1794-1795
Author(s):  
W.M. Kane
Keyword(s):  
Grain Orientation ◽  
Electron Backscatter Diffraction ◽  
Ion Beam ◽  
Three Dimensional ◽  
Electron Backscatter ◽  
Focus Ion Beam ◽  
Backscatter Diffraction

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

scholarly journals Microbending Experiments on Pure Magnesium with Nonbasal Slip Orientation

Materials ◽  
2018 ◽  
Vol 11 (8) ◽  
pp. 1434 ◽  
Author(s):  
Jan Maňák ◽  
David Vokoun
Keyword(s):  
Crystal Lattice ◽  
Cross Section ◽  
Crystal Orientation ◽  
Electron Backscatter Diffraction ◽  
Ion Beam ◽  
Electron Backscatter ◽  
Focus Ion Beam ◽  
Backscatter Diffraction ◽  
Crystallographic Orientations

In the present study, in situ microbending experiments on magnesium single crystalline microcantilevers are presented. Microcantilevers with pentagonal cross-section were fabricated by focus ion beam. Two basic crystallographic orientations of the microcantilevers were investigated: {0001} and {10-10}, i.e., the c-axis perpendicular to and parallel with the cantilever top surface, respectively. After bending, the longitudinal sections of the microcantilevers were analyzed using electron backscatter diffraction to investigate the crystal lattice rotations and accumulated deformations. The stress levels in the loaded cantilevers are strongly dependent on the crystal orientation. Extension twins were found in the {10-10} cantilevers.

Three-Dimensional Microstructure of Thin Copper Foils Revealed by Ion Beam Cutting and Electron Backscatter Diffraction (EBSD)

2005 ◽  
Vol 105 ◽  
pp. 465-0 ◽  
Author(s):  
G. Simons ◽  
Karsten Kunze ◽  
W. Hauffe ◽  
Jürg Dual
Keyword(s):  
Solid Mechanics ◽  
Fracture Strain ◽  
Electron Backscatter Diffraction ◽  
Ion Beam ◽  
Three Dimensional ◽  
Cube Texture ◽  
Rolling Texture ◽  
Copper Foils ◽  
Electron Backscatter ◽  
Backscatter Diffraction

Tensile testing of thin rolled copper foils with thickness ranging from 10 to 250 µm shows a dependence of the fracture strain with respect to the thickness of the foils [G. Simons et al., in Solid Mechanics and its Applications, Vol. 114 (2004), pp. 89-96]. To understand the influence of the microstructure in the foils on this phenomenon the microtexture is investigated by orientation mapping through electron backscatter diffraction (EBSD). As the samples are rather small standard preparation techniques do not apply. Two methods are described which allow the investigation of different section cuts of the samples: Cross sections of the samples were produced by ion beam cutting with a wide beam of 7 keV Kr ions. Internal planes parallel to the specimen surface were made accessible by wet etching. The as-received material possesses a very strong texture consisting mostly of the cube component and some remnants of a previous rolling texture. Specimens tested in a tensile test do not show major microstructural changes compared to virgin samples. After a heat treatment at 300°C the cube texture has significantly weakened in favour of revived rolling components, and the fracture strain increased about ten times relative to the as-is material.

scholarly journals Three-Dimensional Investigations of Finely Grained Materials/ Trójwymiarowa Analiza Materiałów Drobnokrystalicznych

2014 ◽  
Vol 59 (4) ◽  
pp. 1313-1319 ◽  
Author(s):  
P. Bobrowski ◽  
M. Faryna ◽  
A. Bigos ◽  
M. Homa ◽  
A. Sypien ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Energy Dispersive Spectrometry ◽  
Electron Backscatter Diffraction ◽  
Ion Beam ◽  
Three Dimensional ◽  
New Materials ◽  
Crystalline Morphology ◽  
Dual Beam ◽  
Electron Backscatter ◽  
Backscatter Diffraction

Abstract Development of new materials requires application of sophisticated techniques to characterize microstructure in a very detailed way. The combination of Electron Backscatter Diffraction (EBSD) and Energy Dispersive Spectrometry (EDS) with Focused Ion Beam (FIB) are excellent examples of such techniques. They are based on serial sectioning of chosen region in the investigated sample followed by data acquisition using the dual-beam scanning electron microscope equipped with both electron and ion columns. Three kinds of samples have been investigated: a) are anticorrosive Ni-Mo coating on ferritic steel; b) the oxidized Crofer22 APU ferritic stainless steel; c) the Al 6013 aluminum alloy after complex plastic deformation. The obtained results allowed to analyze crystalline morphology, distribution of precipitates as well as to reconstruct internal structure of grains and grains boundaries geometry.

Electron backscatter diffraction determination of grain orientation and constituent phases

1999 ◽  
Vol 4 (2) ◽  
pp. 174-174
Author(s):  
Chen Xiaomei ◽  
Liu Jing ◽  
Wang Jianbo ◽  
Zhang Ruikang ◽  
Wang Dahai ◽  
...  
Keyword(s):  
Grain Orientation ◽  
Electron Backscatter Diffraction ◽  
Diffraction Determination ◽  
Electron Backscatter ◽  
Backscatter Diffraction

scholarly journals Validation of three-dimensional diffraction contrast tomography reconstructions by means of electron backscatter diffraction characterization

2013 ◽  
Vol 46 (4) ◽  
pp. 1145-1150 ◽  
Author(s):  
Melanie Syha ◽  
Andreas Trenkle ◽  
Barbara Lödermann ◽  
Andreas Graff ◽  
Wolfgang Ludwig ◽  
...  
Keyword(s):  
Electron Backscatter Diffraction ◽  
Three Dimensional ◽  
Data Reconstruction ◽  
Characterization Methods ◽  
Diffraction Contrast ◽  
Ebsd Data ◽  
Electron Backscatter ◽  
Backscatter Diffraction ◽  
Tomography Data ◽  
Good Agreement

Microstructure reconstructions resulting from diffraction contrast tomography data of polycrystalline bulk strontium titanate were reinvestigated by means of electron backscatter diffraction (EBSD) characterization. Corresponding two-dimensional grain maps from the two characterization methods were aligned and compared, focusing on the spatial resolution at the internal interfaces. The compared grain boundary networks show a remarkably good agreement both morphologically and in crystallographic orientation. Deviations are critically assessed and discussed in the context of diffraction data reconstruction and EBSD data collection techniques.

scholarly journals Visualization of the Bainite Fine Structure Using EBSD and Euler Angles

2019 ◽  
Vol 1 (1) ◽  
pp. 11
Author(s):  
Yu.V. Yudin ◽  
A.A. Kuklina ◽  
M.V. Maisuradze ◽  
M.S. Karabanalov
Keyword(s):  
Fine Structure ◽  
Electron Backscatter Diffraction ◽  
Three Dimensional ◽  
Diffraction Method ◽  
Bainitic Steel ◽  
Near Surface ◽  
Steel Microstructure ◽  
Electron Backscatter ◽  
Backscatter Diffraction ◽  
Ebsd Method

The electron backscatter diffraction method (EBSD) is widely used to studycrystallographic orientational relationships of the steel microstructure constituentsincluding bainite. Nevertheless the fine structure of bainite (subunits, plates) is notinvestigated by this method. In this paper we propose a technique for visualizing ofthe structure of a bainitic steel near-surface layer using the values of Euler anglesobtained by EBSD method. A three-dimensional picture of the bainite fine structure ofthe HY-TUF steel obtained by the proposed technique is in

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