Effects of K ions doping on the structure, morphology and optical properties of Cu2FeSnS4 thin films prepared by blade-coating process

2017 ◽  
Vol 13 (4) ◽  
pp. 291-294 ◽  
Author(s):  
Shuo Wang ◽  
Rui-xin Ma ◽  
Cheng-yan Wang ◽  
Shi-na Li ◽  
Hua Wang
2014 ◽  
Vol 118 (40) ◽  
pp. 23226-23232 ◽  
Author(s):  
Rajani K Vijayaraghavan ◽  
Anthony P. McCoy ◽  
Lalit Chauhan ◽  
Aidan Cowley ◽  
Richard J. H. Morris ◽  
...  

Author(s):  
Sarika Vishvnbath Jadhav ◽  
Limbraj Sopan Ravangave

<p>Zinc Oxide (ZnO) thin films were deposited for five different molarity (M) of Zinc acetate hydrated (0.075, 0.1, 0.125, 0.15, 0.175 M) using simple spray technique to study the effect of zinc ion concentration on structure, morphology and optical properties. The XRD patterns of deposited ZnO thin films show hexagonal crystal structure with wurtzite symmetry. The effect of molarity on morphology was studied using scanning electron microscopy (SEM). The elemental analysis was studied by using energy dispersive X-ray analysis (EDX). The optical absorption was recorded by using systronics double beam spectrophotometer (2201). Crystallite size estimated from XRD data was in nanometre (nm) range; however, films deposited for 0.15 M zinc acetate show maximum crystallite size (66 nm) as compared to other samples. All the films show low absorption in wide range (340-999 nm) of electromagnetic spectrum. However, ZnO film deposited for 0.15 zinc acetate hydrated shows maximum blue shifting of absorption edge and higher band gap (3.8 eV) as compared to other samples.</p>


NANO ◽  
2018 ◽  
Vol 13 (06) ◽  
pp. 1850062 ◽  
Author(s):  
Sh. Khatami ◽  
L. Fekri Aval ◽  
G. Behzadi Pour

In this study Al-doped Zinc Oxide (AZO) thin films were successfully deposited on the flexible Polymethyl methacrylate (PMMA) substrate by RF magnetron sputtering. The effects of RF power on the crystal structure, morphology, thickness and optical properties of AZO thin films have been investigated. The AZO thin films were analyzed using X-ray diffraction (XRD), field emission scanning electron microscopy (FESEM), DEKTAK 3 profilometer, UV–Visible spectroscopy and room temperature photoluminescence (PL) spectroscopy. The XRD patterns show that increase of RF power leads to increase in the predominant direction along (100) and crystal plane of hexagonal ZnO. Moreover, the transmittance of thin films decreased from 76% to 61% and optical bang gap varied among 3.34[Formula: see text]eV to 3.22[Formula: see text]eV with increasing RF power. The PL spectra show excellent light-emitting characteristics: 375[Formula: see text]nm, 428[Formula: see text]nm, 467[Formula: see text]nm and 505[Formula: see text]nm. The results indicate that the peak intensity increases with increasing RF power from 80[Formula: see text]W to 180[Formula: see text]W.


2013 ◽  
Vol 265 ◽  
pp. 510-518 ◽  
Author(s):  
Cătălina A. Vasilescu ◽  
Maria Crişan ◽  
Adelina C. Ianculescu ◽  
Mălina Răileanu ◽  
Măriuca Gartner ◽  
...  

2012 ◽  
Vol 107 (2) ◽  
pp. 385-392 ◽  
Author(s):  
László Kőrösi ◽  
Szilvia Papp ◽  
Szabolcs Beke ◽  
Béla Pécz ◽  
Róbert Horváth ◽  
...  

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