The Recovery and Recrystallization Behavior of Cold-Compressed Mo-3Nb Single Crystal

Single crystals of Magnesium alloys such as Mg-1Zn-0.5Y, Mg-0.1Y, and Mg-0.1Ce alloys were fabricated in this study by employing the modified Bridgman method. To determine the exact orientation of crystals, pole figure measurement using X-ray diffraction was carried out on each single crystal. Hardness and compression tests were conducted followed by subsequent recrystallization annealing. Recrystallization behavior of Mg alloy single crystals has also been investigated. Fabricated single crystals were deformed in compression mode by 30% reduction. Annealing treatment has been conducted on these samples at temperatures of 300°C for various times from 1 to 20 mins. The microstructure observation and hardness measurement conducted on the recrystallized specimens revealed that static recrystallization of ternary alloy single crystal was very slow, while recrystallization behavior of binary alloy single crystals appeared to be very fast.

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Influence of gibbosity on recrystallization behavior of single crystal blade casting

Journal of Materials Processing Technology ◽

10.1016/j.jmatprotec.2018.04.036 ◽

2018 ◽

Vol 259 ◽

pp. 169-179 ◽

Cited By ~ 4

Author(s):

Runnan Wang ◽

Qingyan Xu ◽

Xianglin Su ◽

Zhonglin Li ◽

Baicheng Liu

Keyword(s):

Single Crystal ◽

Recrystallization Behavior ◽

Blade Casting

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A Preparation of High Resolution Standards for Electron Microscopy. Part II

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100064852 ◽

1971 ◽

Vol 29 ◽

pp. 160-161

Author(s):

Akira Tanaka ◽

David F. Harling

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Carbon Black ◽

Single Crystal ◽

Dark Field ◽

Graphitized Carbon Black ◽

Graphitized Carbon ◽

Dark Field Imaging ◽

Crystal Films ◽

Micro Holes

In the previous paper, the author reported on a technique for preparing vapor-deposited single crystal films as high resolution standards for electron microscopy. The present paper is intended to describe the preparation of several high resolution standards for dark field microscopy and also to mention some results obtained from these studies. Three preparations were used initially: 1.) Graphitized carbon black, 2.) Epitaxially grown particles of different metals prepared by vapor deposition, and 3.) Particles grown epitaxially on the edge of micro-holes formed in a gold single crystal film.The authors successfully obtained dark field micrographs demonstrating the 3.4Å lattice spacing of graphitized carbon black and the Au single crystal (111) lattice of 2.35Å. The latter spacing is especially suitable for dark field imaging because of its preparation, as in 3.), above. After the deposited film of Au (001) orientation is prepared at 400°C the substrate temperature is raised, resulting in the formation of many square micro-holes caused by partial evaporation of the Au film.

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The Recovery and Recrystallization Behavior of Cold-Compressed Mo-3Nb Single Crystal

21502 Static Recrystallization Behavior in Single Crystal Induced by Micro Plastic Forming

Effects of carburization on recrystallization behavior of a single crystal superalloy

Effect of Re on recrystallization behavior of Ni3Al based single crystal alloy

Influence of stress and secondary orientation on the oxidation-induced dynamic recrystallization behavior of a Ni-based single crystal superalloy

Recrystallization Behavior of Nickel-base Single Crystal Superalloys

Recrystallization Behavior and Mechanical Properties of Surface-melted Region of Ni-base Single Crystal Superalloy

Recrystallization Behavior of Single-crystal Hollow Blade Tenon

Fabrication of Mg Alloy Single Crystals Containing Rare Earth Elements and their Mechanical Behavior

Influence of gibbosity on recrystallization behavior of single crystal blade casting

A Preparation of High Resolution Standards for Electron Microscopy. Part II

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