Electrical transport properties of Ru/Cu/n-InP Schottky barrier diode based on temperature-dependent I–V and C–V measurements
2012 ◽
Vol 86
(8)
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pp. 687-695
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2014 ◽
Vol 63
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pp. 186-192
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2011 ◽
Vol 151
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pp. 573-578
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Vol 49
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pp. 125104
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2019 ◽
Vol 12
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pp. 3089-3098
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2015 ◽
Vol 78
(1)
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pp. 151-158
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