A non destructive procedure to observe the microcracks of concrete by scanning electron microscopy

1985 ◽  
Vol 15 (6) ◽  
pp. 1055-1060 ◽  
Author(s):  
J.P. Ollivier
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Non Destructive ◽  
Scanning Electron

Forensic Identifications Aided by Scanning Electron Microscopy of Silicone-Epoxy Microreplicas of Calcified and Cornified Structures

1975 ◽  
Vol 33 ◽  
pp. 678-679 ◽  
Author(s):  
R.F. Sognnaes
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Forensic Science ◽  
George Washington ◽  
Epithelial Surface ◽  
Extended Application ◽  
Tissue Surfaces ◽  
Non Destructive ◽  
Scanning Electron ◽  
Surface Changes

Sufficient experience has been gained during the past five years to suggest an extended application of microreplication and scanning electron microscopy to problems of forensic science. The author's research was originally initiated with a view to develop a non-destructive method for identification of materials that went into objects of art, notably ivory and ivories. This was followed by a very specific application to the identification and duplication of the kinds of materials from animal teeth and tusks which two centuries ago went into the fabrication of the ivory dentures of George Washington. Subsequently it became apparent that a similar method of microreplication and SEM examination offered promise for a whole series of problems pertinent to art, technology and science. Furthermore, what began primarily as an application to solid substances has turned out to be similarly applicable to soft tissue surfaces such as mucous membranes and skin, even in cases of acute, chronic and precancerous epithelial surface changes, and to post-mortem identification of specific structures pertinent to forensic science.

scholarly journals Combining Micro-Raman Spectroscopy and Scanning Electron Microscopy Mapping: A Stony Meteorite Study

Materials ◽  
2021 ◽  
Vol 14 (24) ◽  
pp. 7585
Author(s):  
Maya Musa ◽  
Riccardo Rossini ◽  
Daniela Di Martino ◽  
Maria Pia Riccardi ◽  
Massimiliano Clemenza ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Raman Spectroscopy ◽  
Combined Approach ◽  
Micro Raman Spectroscopy ◽  
Analytical Protocol ◽  
Non Destructive ◽  
The Universe ◽  
Scanning Electron ◽  
Stony Meteorite

Meteorite characterisation represents a privileged and unique opportunity to increase our knowledge about the materials composing the Universe and, particularly, the Proto Solar System. Moreover, meteorites studies evolve contextually with the development of analytical technologies. In the present paper, the results from an unclassified stony meteorite (chondrite) characterisation have been reported on the basis of the innovative analytical protocol presented here. Advanced Mapping by micro-Raman Spectroscopy and Scanning Electron Microscopy equipped with Energy Dispersive Spectroscopy have been combined to disclose molecular and elemental features on the same regions sample at a micrometric resolution. Thanks to their non-destructive properties, the mapping tools of both instruments have been applied to single chondrules analysis and the best match between the mineralogical information and the chemical composition has been obtained. This combined approach proved to be highly suitable in disclosing the crystallinity features of the phases, with in-depth spatial and morphological details too.

IMPEDANCE SPECTROSCOPY (IS), XRD AND SEM OF OXIDE-ADDED Si3N4

2002 ◽  
Vol 16 (14) ◽  
pp. 525-537
Author(s):  
SAADAT. A. SIDDIQI ◽  
NASIR A. KHAN ◽  
M. SABIEH ANWAR
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Impedance Spectroscopy ◽  
Ceramic Materials ◽  
Dielectric Constants ◽  
X Ray Diffraction ◽  
X Ray ◽  
Nyquist Plots ◽  
Non Destructive ◽  
Scanning Electron

Impedance spectroscopy (IS) is a non-destructive technique used for obtaining valuable information about bulk conductivities, dielectric constants, phase composition and grain boundaries of important ceramic materials, amongst many others. We obtained Nyquist plots for four different hot-pressed Si 3 N 4 samples in two different frequency regimes: 1 Hz to 30 MHz and 1 kHz to 100 kHz. The information obtained was compared against results from scanning electron microscopy (SEM) and X-ray diffraction (XRD). The limitations of the frequency response techniques are also discussed.

scholarly journals Microtomographic study on the anatomy of adult male eyes of two mayfly species

Zoosymposia ◽  
2016 ◽  
Vol 11 ◽  
pp. 101-120 ◽  
Author(s):  
JAVIER ALBA-TERCEDOR
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Resolution ◽  
Adult Male ◽  
Transfer Functions ◽  
X Ray ◽  
Internal Structures ◽  
Evolutionary Advantage ◽  
Non Destructive ◽  
Scanning Electron

Here I present the results obtained by scanning male adults of two mayfly (Ephemeroptera) species with a high resolution micro-tomographic scanner, allowing observation of external structures, with similar results to those obtained under scanning electron microscopy. Moreover, this non-destructive technique permits investigation of the internal structures, and to “navigate” inside them, in a way never before imagined. Moreover by using different transfer functions and in accordance with the X-ray transparency, it is possible to assign different colours to highlight different anatomical parts, and to obtain “aesthetic” images. Results are compared and discussed with previous findings. It is postulated that differences in the diameter sizes of the ommatidia, when comparing dorso-frontal and ventro-lateral parts of the compounds eyes, represent an evolutionary advantage enabling increased accuracy in movement displacement detection of competing males within the swarm.

Resolution of Non-Destructive Imaging by Controlled Acceleration Voltage in Scanning Electron Microscopy

2021 ◽  
pp. 113316
Author(s):  
Kelvin Elphick ◽  
Bernardus D. Aditya ◽  
Jiaqi Wu ◽  
Michihiro Ohta ◽  
Atsufumi Hirohata
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Non Destructive ◽  
Acceleration Voltage ◽  
Scanning Electron

Microstructure of Ni/Al2O3 Electrodeposited Coatings Studied with XRD and SEM Techniques

2013 ◽  
Vol 203-204 ◽  
pp. 133-136
Author(s):  
Anna Góral ◽  
Marek Nowak ◽  
Joanna Wojewoda-Budka
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Nanocomposite Coatings ◽  
X Ray Diffraction ◽  
X Ray ◽  
Electrodeposited Coatings ◽  
Electrochemically Deposited ◽  
Steel Substrates ◽  
Non Destructive ◽  
Scanning Electron

Our interests are focused on the Ni/Al2O3 nanocomposite coatings electrochemically deposited in modified Watt’s-type baths into which α-Al2O3 nanopowder is added on steel substrates. The effect of different amounts of α-Al2O3 phase in the electrolyte baths on microstructure of electrodeposited Ni/Al2O3 coatings is investigated. In order to study the coatings the non-destructive X-ray diffraction techniques are applied. As indirect techniques, they are supported by imaging methods, especially scanning electron microscopy.

Microchannel plate-based detection systems for Scanning Electron Microscopy

1989 ◽  
Vol 47 ◽  
pp. 726-727
Author(s):  
J. Gray ◽  
D. Corey ◽  
G. Ellis ◽  
R. Sokol
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Integrated Circuits ◽  
Low Voltage ◽  
Microchannel Plate ◽  
Destructive Testing ◽  
Detection Systems ◽  
Voltage Contrast ◽  
Non Destructive ◽  
Scanning Electron

MicroChannel plate (MCP)-based detectors have distinct advantages over scintillator or solid-state types for low voltage applications in scanning electron microscopy. MCPs exhibit excellent detection efficiencies for electrons of energy down to lOOev and are usable at even lower energies, making them ideal detection elements for non-destructive testing and low voltage contrast measurements on integrated circuits. Major advantages of MCP-based detection systems include the following

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