Atomic force microscope imaging of the surface roughness of SCS- and TiB2-coated SiC fibres and uncoated sapphire fibres

The relationship of the friction coefficient and the MTC were discussed, and the MTC and its effects on surface roughness were a theoretical analysised and experimental verification by AFM (atomic force microscope). The results show that the theoretical MTC tends to be minimal value then before the adhering effect to reach remarkable. Appropriate adjustments cutting parameters, the cutting process can always micro-cutting phase to reach the steady-thin chip, and no plowing phenomenon. So the surface residues highly were reduced and higher surface quality was achieved.

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Extension of the range of profile surface roughness measurements using metrological atomic force microscope

Precision Engineering ◽

10.1016/j.precisioneng.2019.01.002 ◽

2019 ◽

Vol 56 ◽

pp. 321-329 ◽

Cited By ~ 3

Author(s):

Ichiko Misumi ◽

Kentaro Sugawara ◽

Ryosuke Kizu ◽

Akiko Hirai ◽

Satoshi Gonda

Keyword(s):

Surface Roughness ◽

Atomic Force Microscope ◽

Atomic Force ◽

Roughness Measurements

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In Situ Atomic Force Microscope Imaging of Supported Lipid Bilayers

Single Molecules ◽

10.1002/1438-5171(200107)2:2<105::aid-simo105>3.0.co;2-0 ◽

2001 ◽

Vol 2 (2) ◽

pp. 105-108 ◽

Cited By ~ 27

Author(s):

Thomas Kaasgaard ◽

Chad Leidy ◽

John Hjort Ipsen ◽

Ole G. Mouritsen ◽

Kent Jørgensen

Keyword(s):

Atomic Force Microscope ◽

Lipid Bilayers ◽

Supported Lipid Bilayers ◽

Atomic Force ◽

Microscope Imaging

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Relationship Between Stress and Surface Roughness in Krypton Implanted MgO

MRS Proceedings ◽

10.1557/proc-356-57 ◽

1994 ◽

Vol 356 ◽

Author(s):

Laurence Gea ◽

Jean-Luc Loubet ◽

Roger Brenier ◽

Paul Thevenard

Keyword(s):

Surface Roughness ◽

Atomic Force Microscope ◽

Single Crystals ◽

Internal Stresses ◽

Post Irradiation ◽

Implantation Damage ◽

Atomic Force ◽

Microindentation Technique ◽

Good Agreement

Abstract(001) MgO single crystals were implanted with 150 keV krypton ions (Kr+) at a fluence of 5.1016 ions.cm-2 . The implanted surface, observed with an Atomic Force Microscope (AFM) exhibits striking features that can be described as undulations with a wavelength of 0.5 [μm. We correlate these features to the decrease in density and the stresses induced by the implantation damage. As a matter of fact, a model of surface instabilities provides a relationship between the wavelength of the ondulations and internal stresses. Using this model, implantation stresses are calculated to 2.2 GPa. This is in good agreement with the value of 2 GPa obtained with the help of the microindentation technique and the literature data. Some effects of an ionizing post-irradiation on stress and surface roughness are described.

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