Extension of the range of profile surface roughness measurements using metrological atomic force microscope

For this study we have used a contact mode atomic force microscope (AFM) to study to topography of fluidized cracking catalysts (FCC), before and after contamination with 5% vanadium. We selected the AFM because of its ability to well characterize the surface roughness of materials down to the atomic level. It is believed that the cracking in the FCCs occurs mainly on the catalysts top 10-15 μm suggesting that the surface corrugation could play a key role in the FCCs microactivity properties. To test this hypothesis, we chose vanadium as a contaminate because this metal is capable of irreversibly destroying the FCC crystallinity as well as it microporous structure. In addition, we wanted to examine the extent to which steaming affects the vanadium contaminated FCC. Using the AFM, we measured the surface roughness of FCCs, before and after contamination and after steaming.We obtained our FCC (GRZ-1) from Davison. The FCC is generated so that it contains and estimated 35% rare earth exchaged zeolite Y, 50% kaolin and 15% binder.

Download Full-text

Atomic force microscopy comparative analysis of the surface roughness of two posterior chamber phakic intraocular lens models: ICL versus IPCL

BMC Ophthalmology ◽

10.1186/s12886-021-02039-6 ◽

2021 ◽

Vol 21 (1) ◽

Author(s):

Juan Gros-Otero ◽

Samira Ketabi ◽

Rafael Cañones-Zafra ◽

Montserrat Garcia-Gonzalez ◽

Cesar Villa-Collar ◽

...

Keyword(s):

Surface Roughness ◽

Atomic Force Microscopy ◽

Intraocular Lenses ◽

Posterior Chamber ◽

Anterior Surface ◽

Contact Mode ◽

Force Microscopy ◽

Atomic Force ◽

Phakic Intraocular Lenses ◽

Roughness Measurements

Abstract Background To compare the anterior surface roughness of two commercially available posterior chamber phakic intraocular lenses (IOLs) using atomic force microscopy (AFM). Methods Four phakic IOLs were used for this prospective, experimental study: two Visian ICL EVO+ V5 lenses and two iPCL 2.0 lenses. All of them were brand new, were not previously implanted in humans, were monofocal and had a dioptric power of − 12 diopters (D). The anterior surface roughness was assessed using a JPK NanoWizard II® atomic force microscope in contact mode immersed in liquid. Olympus OMCL-RC800PSA commercial silicon nitride cantilever tips were used. Anterior surface roughness measurements were made in 7 areas of 10 × 10 μm at 512 × 512 point resolution. The roughness was measured using the root-mean-square (RMS) value within the given regions. Results The mean of all anterior surface roughness measurements was 6.09 ± 1.33 nm (nm) in the Visian ICL EVO+ V5 and 3.49 ± 0.41 nm in the iPCL 2.0 (p = 0.001). Conclusion In the current study, we found a statistically significant smoother anterior surface in the iPCL 2.0 phakic intraocular lenses compared with the VISIAN ICL EVO+ V5 lenses when studied with atomic force microscopy.

Download Full-text

Study on Surface Roughness Based on Dynamic Minimum Thickness of Cut

Applied Mechanics and Materials ◽

10.4028/www.scientific.net/amm.88-89.34 ◽

2011 ◽

Vol 88-89 ◽

pp. 34-37

Author(s):

Kuai Ji Cai

Keyword(s):

Surface Roughness ◽

Friction Coefficient ◽

Atomic Force Microscope ◽

Surface Quality ◽

Experimental Verification ◽

Cutting Parameters ◽

Minimum Thickness ◽

Atomic Force ◽

Relationship Of ◽

The Relationship

The relationship of the friction coefficient and the MTC were discussed, and the MTC and its effects on surface roughness were a theoretical analysised and experimental verification by AFM (atomic force microscope). The results show that the theoretical MTC tends to be minimal value then before the adhering effect to reach remarkable. Appropriate adjustments cutting parameters, the cutting process can always micro-cutting phase to reach the steady-thin chip, and no plowing phenomenon. So the surface residues highly were reduced and higher surface quality was achieved.

Download Full-text

Relationship Between Stress and Surface Roughness in Krypton Implanted MgO

MRS Proceedings ◽

10.1557/proc-356-57 ◽

1994 ◽

Vol 356 ◽

Author(s):

Laurence Gea ◽

Jean-Luc Loubet ◽

Roger Brenier ◽

Paul Thevenard

Keyword(s):

Surface Roughness ◽

Atomic Force Microscope ◽

Single Crystals ◽

Internal Stresses ◽

Post Irradiation ◽

Implantation Damage ◽

Atomic Force ◽

Microindentation Technique ◽

Good Agreement

Abstract(001) MgO single crystals were implanted with 150 keV krypton ions (Kr+) at a fluence of 5.1016 ions.cm-2 . The implanted surface, observed with an Atomic Force Microscope (AFM) exhibits striking features that can be described as undulations with a wavelength of 0.5 [μm. We correlate these features to the decrease in density and the stresses induced by the implantation damage. As a matter of fact, a model of surface instabilities provides a relationship between the wavelength of the ondulations and internal stresses. Using this model, implantation stresses are calculated to 2.2 GPa. This is in good agreement with the value of 2 GPa obtained with the help of the microindentation technique and the literature data. Some effects of an ionizing post-irradiation on stress and surface roughness are described.

Download Full-text

Surface roughness analysis of ceramic bracket slots using atomic force microscope

The Korean Journal of Orthodontics ◽

10.4041/kjod.2010.40.5.294 ◽

2010 ◽

Vol 40 (5) ◽

pp. 294 ◽

Cited By ~ 9

Author(s):

Ki-Ho Park ◽

Hyun-Joo Yoon ◽

Su-Jung Kim ◽

Gi-Ja Lee ◽

Hun-Kuk Park ◽

...

Keyword(s):

Surface Roughness ◽

Atomic Force Microscope ◽

Atomic Force ◽

Roughness Analysis ◽

Ceramic Bracket

Download Full-text

Atomic force microscope imaging of the surface roughness of SCS- and TiB2-coated SiC fibres and uncoated sapphire fibres

Composites ◽

10.1016/0010-4361(95)98910-d ◽

1995 ◽

Vol 26 (9) ◽

pp. 619-629 ◽

Cited By ~ 6

Author(s):

Thomas L. Warren ◽

Dusan Krajcinovic ◽

Arunava Majumdar

Keyword(s):

Surface Roughness ◽

Atomic Force Microscope ◽

Atomic Force ◽

Microscope Imaging

Download Full-text

Investigations of Surface Roughness of GaN Based Gas Sensor Using Atomic Force Microscope

2005 Asian Conference on Sensors and the International Conference on New Techniques in Pharmaceutical and Biomedical Research ◽

10.1109/asense.2005.1564544 ◽

2006 ◽

Author(s):

A.Y. Hudeish ◽

A.A. Aziz ◽

Z. Hassan ◽

C.K. Tan ◽

H.A. Hassan ◽

...

Keyword(s):

Surface Roughness ◽

Atomic Force Microscope ◽

Gas Sensor ◽

Atomic Force

Download Full-text

STUDY OF THE MORPHOLOGICAL MODIFICATIONS INDUCED BY LASER ANNEALING OF PREAMORPHIZED SILICON

Surface Review and Letters ◽

10.1142/s0218625x01001208 ◽

2001 ◽

Vol 08 (05) ◽

pp. 441-445 ◽

Cited By ~ 3

Author(s):

Y. F. CHONG ◽

K. L. PEY ◽

Y. F. LU ◽

A. T. S. WEE ◽

A. SEE

Keyword(s):

Surface Roughness ◽

Laser Fluence ◽

Laser Annealing ◽

Periodic Structures ◽

Threshold Fluence ◽

High Fluence ◽

Force Microscopy ◽

Atomic Force ◽

Laser Anneal ◽

Roughness Measurements

Atomic force microscopy was employed to characterize the morphological modifications induced by laser annealing of preamorphized silicon. Laser irradiation was performed at different fluence with fixed pulse durations of 23 ns. In all cases, the laser fluence used is above the threshold fluence that is needed to melt the preamorphized layer. Roughness measurements show that the surface roughness of the silicon samples increases when the laser fluence increases. Since the laser anneal was performed in air, the changes in morphology may be associated with the surface oxide formed. When a high fluence was employed, the extension of melting was sufficient to remove all surface features of the as-implanted sample but apparently there was not enough time to completely redistribute the material upon solidification. As a result, ripple-like periodic structures are formed on the surface. Therefore, a low laser fluence should be used whenever possible in the annealing of silicon samples.

Download Full-text