A technique for observing the cross sectional damage profiles in He-Ion irradiated 316 stainless steel by transmission electron microscopy

1983 ◽  
Vol 114 (2-3) ◽  
pp. 338-340 ◽  
Author(s):  
S. Hamada ◽  
M. Tanaka ◽  
K. Shiraishi
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Stainless Steel ◽  
Cross Sectional ◽  
316 Stainless Steel ◽  
Transmission Electron ◽  
The Cross

Synthesis and Characterization of Nanocrystalline 316-Stainless Steel Coatings by High Velocity Oxy-Fuel Spraying

1998 ◽  
Author(s):  
M.L. Lau ◽  
H.G. Jiang ◽  
E.J. Lavernia
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Grain Size ◽  
Stainless Steel ◽  
High Velocity ◽  
Polished Surface ◽  
316 Stainless Steel ◽  
Transmission Electron ◽  
Average Grain Size ◽  
Stainless Steel Coatings

Abstract The present paper describes the synthesis of nanocrystalline 316-stainless steel coatings by high velocity oxy-fuel (HVOF) thermal spraying. The feedstock powders were synthesized by mechanical milling to produce flake-shaped agglomerates with an average grain size of less than 100 nm. The powders were introduced into the HVOF spray to successfully produce nanocrystalline coatings. X-ray diffraction analysis and transmission electron microscopy were used to determine the average grain size of the milled powders. Scanning electron microscopy and transmission electron microscopy were used to study the morphology of the nanometric particles and the microstructure of the as-sprayed coatings. The properties of various coating materials were characterized by microhardness measurements performed on the polished surface of the cross section.

Amorphization Mechanism of Si/Ge Superlattices Upon Ion Implantation

1998 ◽  
Vol 540 ◽  
Author(s):  
N.A. Sobolev ◽  
U. Kaiser ◽  
I.I. Khodos ◽  
H. Presting ◽  
U. König
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Ion Implantation ◽  
Point Defects ◽  
Dose Range ◽  
Cross Sectional ◽  
Layer Interaction ◽  
Transmission Electron ◽  
The Cross ◽  
Electron Microdiffraction

AbstractThe damage production in the Si9Ge6 superlattices (SLs) upon implantation of 150 keV Ar+ ions at 300 K was studied my means of the cross-sectional transmission electron microscopy (XTEM) and electron microdiffraction. It was found that the amorphization occurs in a narrow dose range of (1 – 2) × 1014 cm-2 via accumulation of point defects. The conclusion drawn earlier (Mater. Sci. Forum 248-249, 289 (1997)) on the coherent amorphization of the Si and Ge layers in the SLs was confirmed. Possible mechanisms of the layer interaction leading to the observed behavior are discussed.

Transmission electron microscopy of high pressure metal dusted 316 stainless steel

2004 ◽  
Vol 385 (1-2) ◽  
pp. 292-299 ◽  
Author(s):  
K STEVENS ◽  
T LEVI ◽  
I MINCHINGTON ◽  
N BRIGGS ◽  
V KEAST ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Pressure ◽  
Stainless Steel ◽  
316 Stainless Steel ◽  
Transmission Electron

Rocking-Angle Ion-Milling of Cross-Sectional Samples for Transmission Electron Microscopy of Multi-Layer Systems

1997 ◽  
Vol 480 ◽  
Author(s):  
Jeong Soo Lee ◽  
Hyun Ha Kim ◽  
Young Woo Jeong
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Incidence Angle ◽  
Ion Beam ◽  
Quantitative Information ◽  
Ion Milling ◽  
Angle Variation ◽  
Cross Sectional ◽  
Transmission Electron ◽  
The Cross

AbstractThe cross-sectional transmission electron microscopy (TEM) specimens of Pt/Ti/SiO2/Si, RuO2/SiO2/Si, W/TiN/SiO2/Si, (Pb,La)TiO3/Pt/MgO, Bi4Ti3O12/Lal-xCaxMnO3/MgO, and GaN/Al2O3 were successfully made by the rocking-angle ion-milling technique. The differential thinning problems could be effectively mitigated when the rocking-angle and the ion-beam incidence angle were optimized for each heterostructure. It was found that the sputtering yield ratio between the layer milled most quickly and the layer milled most slowly is one of the important factors which determine the optimum rocking-angle ion-milling condition. The atomic force microscopy study on the surface topography of the cross-sectional Pt/Ti/SiO2/Si TEM sample after ion-milling provided quantitative information about the effects of the rocking-angle variation. A parameter which is the ratio between the layer with a minimum electron transparency and the layer with a maximum electron transparency was suggested.

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