Application of a quartz crystal thickness monitor in the continuous measurement of thickness of evaporated and sputtered metal films

1971 ◽  
Vol 10 (2) ◽  
pp. 131
Keyword(s):  
Quartz Crystal ◽  
Continuous Measurement ◽  
Metal Films ◽  
Crystal Thickness ◽  
Measurement Of Thickness

An apparatus for the continuous measurement of thickness during the electropolishing of superconducting cavities

2021 ◽  
Vol 92 (2) ◽  
pp. 023307
Author(s):  
M. Bertucci ◽  
A. Bosotti ◽  
R. Campari ◽  
A. D’Ambros ◽  
A. Gresele ◽  
...  
Keyword(s):  
Continuous Measurement ◽  
Superconducting Cavities ◽  
Measurement Of Thickness

Control of porosity in fluoride thin films prepared by vapor deposition

2007 ◽  
Vol 22 (7) ◽  
pp. 2012-2016 ◽  
Author(s):  
Hakkwan Kim ◽  
Alexander H. King
Keyword(s):  
Thin Films ◽  
Substrate Temperature ◽  
Vapor Deposition ◽  
Lithium Fluoride ◽  
Quartz Crystal ◽  
Thermal Evaporation ◽  
Magnesium Fluoride ◽  
Crystal Thickness ◽  
Glass Substrates ◽  
Atomic Force

We have measured the porosity in thin films of lithium fluoride (LiF), magnesium fluoride (MgF2), barium fluoride (BaF2), and calcium fluoride (CaF2) as a function of the substrate temperature for films deposited by thermal evaporation onto glass substrates. The amount of porosity in the thin films was measured using an atomic force microscope and a quartz crystal thickness monitor. The porosity was very sensitive to the substrate temperature and decreased as the substrate temperature increased. Consistent behavior was observed among all of the materials in this study.

scholarly journals The Accurate Control of the Thickness of Evaporated Carbon Films

1999 ◽  
Vol 7 (3) ◽  
pp. 27-27
Author(s):  
Alwyn Eades
Keyword(s):  
Carbon Coating ◽  
Quartz Crystal ◽  
Carbon Film ◽  
Carbon Films ◽  
Crystal Thickness

There are two approaches to determining the thickness of a carbon film evaporated onto a specimen. One approach is to do the evaporation first and to measure the result afterwards. There are several ways to do this. The second approach is to put down a determined amount of carbon in the first place. This clearly has advantages in many cases. The method described here is of this second kind. The thickness of the carbon coating is not measured, but by a predetermined recipe, the amount put on is controlled at the time of evaporation, In principle, the thickness could be measured during the evaporation with a quartz-crystal thickness monitor. However, we find that the monitor we have does not work well with carbon.

scholarly journals System forin situstudies of atmospheric corrosion of metal films using soft x-ray spectroscopy and quartz crystal microbalance

2007 ◽  
Vol 78 (8) ◽  
pp. 083110 ◽  
Author(s):  
J. Forsberg ◽  
L.-C. Duda ◽  
A. Olsson ◽  
T. Schmitt ◽  
J. Andersson ◽  
...  
Keyword(s):  
Quartz Crystal Microbalance ◽  
Atmospheric Corrosion ◽  
Quartz Crystal ◽  
Metal Films ◽  
X Ray

Digital mixer for quartz crystal thickness monitor

Vacuum ◽  
1996 ◽  
Vol 47 (1) ◽  
pp. 87-89 ◽  
Author(s):  
L Shivalingappa ◽  
MP Srinivasan ◽  
S Mohan
Keyword(s):  
Quartz Crystal ◽  
Crystal Thickness

White-beam topography of Rayleigh waves: a numerical study

1999 ◽  
Vol 32 (2) ◽  
pp. 154-159 ◽  
Author(s):  
V. Mocella ◽  
Y. Epelboin
Keyword(s):  
Piezoelectric Transducer ◽  
Rayleigh Waves ◽  
Vibration Amplitude ◽  
Quartz Crystal ◽  
Numerical Study ◽  
Image Contrast ◽  
Crystal Thickness ◽  
Optimal Thickness ◽  
White Beam

This paper analyses the contrast of white-beam stroboscopic synchrotron topographs of Rayleigh waves induced by a piezoelectric transducer in an α-quartz crystal. The aim of the present investigation is to study the influence of the crystal thickness and of the vibration amplitude on the image contrast. A periodic optimal thickness is found that maximizes the film contrast.

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