Metastable phase formation in thin films formed by laser breakdown chemical vapor deposition

1986 ◽  
Vol 20 (11) ◽  
pp. 1519-1522 ◽  
Author(s):  
S.K. Menon ◽  
T.R. Jervis
1986 ◽  
Vol 80 ◽  
Author(s):  
S. K. Henon ◽  
T. R. Jervis ◽  
M. Nastasi

AbstractThin films produced by laser breakdown chemical vapor deposition from nickel and iron carbonyls and by implanting Ni foils with varying levels of C have been characterizea by transmission electron microscopy. Decomposition of Ni(CO)4 produces polycrystalline films of fcc Ni and metastable ordered nexaogonal Ni3C. This metastable phase is identical to that produced by gas carburization, rapid solidification of Ni-C melts, and ion implantation ot C into Ni at low;co ncentrations. Increasing the H2 content in the gas mixture during laser deposition reduces the grain size of the films significantly witn grain sizes smaller than 10 nanometers produced. Laser uecomposition of Fe(CO)5 produces films with islands of fcc gamma-Fe and finely dispersed metastable Fe3C (Cementite). In addition, the ferrous oxides Fe2O3 and Fe3O4 were found in these samples. Implants of C into pure Ni foils at 77°K and at a concentration of 35 at.% produced amorphous layers. Implants at the same dose at room temperature did not proouce amorphous layers.


1992 ◽  
Vol 4 (1) ◽  
pp. 11-14 ◽  
Author(s):  
Andrew N. MacInnes ◽  
Michael B. Power ◽  
Andrew R. Barron

2018 ◽  
Vol 10 (3) ◽  
pp. 03001-1-03001-6 ◽  
Author(s):  
Bharat Gabhale ◽  
◽  
Ashok Jadhawar ◽  
Ajinkya Bhorde ◽  
Shruthi Nair ◽  
...  

2009 ◽  
Vol 23 (09) ◽  
pp. 2159-2165 ◽  
Author(s):  
SUDIP ADHIKARI ◽  
MASAYOSHI UMENO

Nitrogen incorporated hydrogenated amorphous carbon (a-C:N:H) thin films have been deposited by microwave surface-wave plasma chemical vapor deposition on silicon and quartz substrates, using helium, methane and nitrogen ( N 2) as plasma source. The deposited a-C:N:H films were characterized by their optical, structural and electrical properties through UV/VIS/NIR spectroscopy, Raman spectroscopy, atomic force microscope and current-voltage characteristics. The optical band gap decreased gently from 3.0 eV to 2.5 eV with increasing N 2 concentration in the films. The a-C:N:H film shows significantly higher electrical conductivity compared to that of N 2-free a-C:H film.


2017 ◽  
Vol 19 (8) ◽  
pp. 1700193 ◽  
Author(s):  
Mattias Vervaele ◽  
Bert De Roo ◽  
Jolien Debehets ◽  
Marilyne Sousa ◽  
Luman Zhang ◽  
...  

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