Scanning tunneling microscopy characterization of C70 thin films

Thin Solid Films ◽

10.1016/0040-6090(92)90884-e ◽

1992 ◽

Vol 216 (1) ◽

pp. 142-144 ◽

Author(s):

Shengzhong Liu ◽

Manfred M. Kappes

Keyword(s):

Scanning Tunneling Microscopy ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Microscopy Characterization

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Scanning Tunneling Microscopy for Morphological Characterization of InN Thin Films

Review of Progress in Quantitative Nondestructive Evaluation ◽

10.1007/978-1-4684-5772-8_139 ◽

1990 ◽

pp. 1093-1099 ◽

Author(s):

R. Fainchtein ◽

D. Dayan ◽

W. A. Bryden ◽

J. C. Murphy ◽

T. O. Poehler

Keyword(s):

Scanning Tunneling Microscopy ◽

Morphological Characterization ◽

Scanning Tunneling ◽

Tunneling Microscopy

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Surface characterization of Al–Cu–Fe thin films by scanning tunneling microscopy and scanning tunneling spectroscopy

Applied Surface Science ◽

10.1016/s0169-4332(99)00105-1 ◽

1999 ◽

Vol 147 (1-4) ◽

pp. 140-145 ◽

Author(s):

V Srinivas ◽

S Kasiviswanathan ◽

Pranabesh Barua ◽

B.K Mathur

Keyword(s):

Scanning Tunneling Microscopy ◽

Surface Characterization ◽

Scanning Tunneling Spectroscopy ◽

Tunneling Spectroscopy ◽

Scanning Tunneling ◽

Tunneling Microscopy

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Scanning tunneling microscopy and atomic force microscopy characterization of polystyrene spin-coated onto silicon surfaces

Langmuir ◽

10.1021/la00039a030 ◽

1992 ◽

Vol 8 (3) ◽

pp. 920-926 ◽

Author(s):

T. G. Stange ◽

Roy Mathew ◽

D. Fennell Evans ◽

W. A. Hendrickson

Keyword(s):

Atomic Force Microscopy ◽

Scanning Tunneling Microscopy ◽

Silicon Surfaces ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Microscopy Characterization ◽

Atomic Force Microscopy Characterization

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High-Resolution Scanning Tunneling Microscopy Characterization of Mixed Monolayer Protected Gold Nanoparticles

ACS Nano ◽

10.1021/nn402414b ◽

2013 ◽

Vol 7 (10) ◽

pp. 8529-8539 ◽

Author(s):

Quy Khac Ong ◽

Javier Reguera ◽

Paulo Jacob Silva ◽

Mauro Moglianetti ◽

Kellen Harkness ◽

...

Keyword(s):

Gold Nanoparticles ◽

High Resolution ◽

Scanning Tunneling Microscopy ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Mixed Monolayer ◽

Microscopy Characterization

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Characterization of ZnO thin films using scanning tunneling microscopy

2007 International Workshop on Physics of Semiconductor Devices ◽

10.1109/iwpsd.2007.4472555 ◽

2007 ◽

Author(s):

Harish Bahadur ◽

S. B. Samanta ◽

R. K. Sharma ◽

Sudhir Chandra

Keyword(s):

Scanning Tunneling Microscopy ◽

Zno Thin Films ◽

Scanning Tunneling ◽

Tunneling Microscopy

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In situ scanning tunneling microscopy characterization of thienothiophene-based semiconducting organic molecules adsorbed on a Au(111) electrode

Surface Science ◽

10.1016/j.susc.2013.05.013 ◽

2013 ◽

Vol 616 ◽

pp. 155-160 ◽

Author(s):

Shu Rong Luo ◽

Sih Zih Chen ◽

Ya Hua Hsu ◽

Shueh Lin Yau ◽

Yu-Jou Lin ◽

...

Keyword(s):

Scanning Tunneling Microscopy ◽

Organic Molecules ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Microscopy Characterization

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Characterization of the topography and thickness of gallium thin films by scanning tunneling microscopy

Instrumentation Science & Technology ◽

10.1080/10739149.2016.1176035 ◽

2016 ◽

Vol 44 (6) ◽

pp. 629-641 ◽

Author(s):

Radu T. Brătfălean ◽

Daniel Marconi ◽

Alia Colniță

Keyword(s):

Scanning Tunneling Microscopy ◽

Scanning Tunneling ◽

Tunneling Microscopy

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Scanning Tunneling Microscopy Characterization of InAs Nanostructures Formed on GaAs(001)

Nano-Optoelectronics - NanoScience and Technology ◽

10.1007/978-3-642-56149-8_4 ◽

2002 ◽

pp. 99-116

Author(s):

Shigehiko Hasegawa ◽

Hisao Nakashima

Keyword(s):

Scanning Tunneling Microscopy ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Microscopy Characterization

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Scanning Tunneling Microscopy Characterization of Heterostructures

Heterostructure Epitaxy and Devices ◽

10.1007/978-94-009-0245-9_14 ◽

1996 ◽

pp. 65-74

Author(s):

Eicke R. Weber ◽

Jun-Fei Zheng ◽

Xiao Liu

Keyword(s):

Scanning Tunneling Microscopy ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Microscopy Characterization

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Scanning tunneling microscopy characterization of metalorganic chemical vapor deposition grown GaN

Materials Science and Engineering B ◽

10.1016/s0921-5107(96)01791-6 ◽

1997 ◽

Vol 44 (1-3) ◽

pp. 414-418 ◽

Author(s):

Joachim Horna ◽

Dimitris Pavlidis ◽

Yongjo Park ◽

Hans L. Hartnagel

Keyword(s):

Chemical Vapor Deposition ◽

Scanning Tunneling Microscopy ◽

Vapor Deposition ◽

Metalorganic Chemical Vapor Deposition ◽

Chemical Vapor ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Microscopy Characterization ◽

Metalorganic Chemical

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