Characterization of the topography and thickness of gallium thin films by scanning tunneling microscopy
2016 ◽
Vol 44
(6)
◽
pp. 629-641
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1990 ◽
pp. 1093-1099
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1999 ◽
Vol 147
(1-4)
◽
pp. 140-145
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2008 ◽
Vol 112
(25)
◽
pp. 9336-9345
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Keyword(s):
2000 ◽
Vol 194-195
◽
pp. 129-136
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2016 ◽
Vol 42
◽
pp. 14-46
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