The development of a 6 to 7 MeV photon field for instrument calibration

1985 ◽  
Vol 10-11 ◽  
pp. 942-945 ◽  
Author(s):  
K.C. Duvall ◽  
C.G. Soares ◽  
H.T. Heaton ◽  
S.M. Seltzer
Keyword(s):  
Instrument Calibration ◽  
Photon Field

Distortion in lattice-resolution scanned-probe microscope images

1993 ◽  
Vol 51 ◽  
pp. 522-523
Author(s):  
L. Fei
Keyword(s):  
Film Studies ◽  
Lattice Structure ◽  
Substrate Material ◽  
Repulsive Force ◽  
Instrument Calibration ◽  
Microscope Images ◽  
Probe Microscope ◽  
Electron Microscopes ◽  
Diffraction Patterns ◽  
Lattice Resolution

Scanned probe microscopes (SPM) have been widely used for studying the structure of a variety material surfaces and thin films. Interpretation of SPM images, however, remains a debatable subject at best. Unlike electron microscopes (EMs) where diffraction patterns and images regularly provide data on lattice spacings and angles within 1-2% and ∽1° accuracy, our experience indicates that lattice distances and angles in raw SPM images can be off by as much as 10% and ∽6°, respectively. Because SPM images can be affected by processes like the coupling between fast and slow scan direction, hysteresis of piezoelectric scanner, thermal drift, anisotropic tip and sample interaction, etc., the causes for such a large discrepancy maybe complex even though manufacturers suggest that the correction can be done through only instrument calibration.We show here that scanning repulsive force microscope (SFM or AFM) images of freshly cleaved mica, a substrate material used for thin film studies as well as for SFM instrument calibration, are distorted compared with the lattice structure expected for mica.

Making Known Concentrations for Instrument Calibration

AIHAJ ◽  
1961 ◽  
Vol 22 (5) ◽  
pp. 392-402 ◽  
Author(s):  
H. N. Cotabish ◽  
P. W. McConnaughey ◽  
H. C. Messer
Keyword(s):  
Instrument Calibration

scholarly journals Probing higher order correlations of the photon field with photon number resolving avalanche photodiodes

2011 ◽  
Vol 19 (14) ◽  
pp. 13268 ◽  
Author(s):  
J. F. Dynes ◽  
Z. L. Yuan ◽  
A. W. Sharpe ◽  
O. Thomas ◽  
A. J. Shields
Keyword(s):  
Avalanche Photodiodes ◽  
Photon Number ◽  
Higher Order ◽  
Photon Field

scholarly journals The acceptable range of roughness instrument calibration factor

2021 ◽  
Vol 1816 (1) ◽  
pp. 012028
Author(s):  
A Rahman ◽  
N Alfiyati ◽  
O Novyanto ◽  
N L Kartika ◽  
R Z Amdani
Keyword(s):  
Calibration Factor ◽  
Instrument Calibration ◽  
Acceptable Range

LOCATING THE BLAZAR EMISSION SITE WITH FERMI VARIABILITY

2012 ◽  
Vol 08 ◽  
pp. 37-42
Author(s):  
MARKOS GEORGANOPOULOS ◽  
AMANDA DOTSON ◽  
DEMOSTHENES KAZANAS ◽  
ERIC PERLMAN
Keyword(s):  
Energy Dissipation ◽  
Broad Line ◽  
Jet Formation ◽  
Spectral Variability ◽  
Ongoing Debate ◽  
Broad Line Region ◽  
Photon Field ◽  
First Case ◽  
Line Region

This work presents a method for settling the following ongoing debate: is the GeV emission of powerful blazars produced inside the sub-pc size broad line region (BLR) or further out at scales of ~ 10 pc where the IR photon field of the dusty molecular torus dominates over that the UV field of the BLR? In the first case the GeV emission is most probably external Compton (EC) scattering of the ~ 10 eV BLR photons21, while in the second the seed photons for the EC GeV emission are the ~ 0.1 eV photons of the dust9 in the molecular torus8. The issue of the energy dissipation location is connected to the jet formation and collimation process25 and, as we argue here, can be resolved with Fermi spectral variability observations.

Satellite Instrument Calibration for Measuring Global Climate Change: Report of a Workshop

2005 ◽  
Vol 86 (9) ◽  
pp. 1303-1314 ◽  
Author(s):  
George Ohring ◽  
Bruce Wielicki ◽  
Roy Spencer ◽  
Bill Emery ◽  
Raju Datla
Keyword(s):  
Climate Change ◽  
Global Climate Change ◽  
Global Climate ◽  
Instrument Calibration
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