Vacuum arc deposition of thin films from an LaB6 cathode

1996 ◽  
Vol 82 (3) ◽  
pp. 247-253 ◽  
Author(s):  
S. Schmidbauer ◽  
H. Klose ◽  
A. Ehrlich ◽  
M. Friedrich ◽  
M. Röder ◽  
...  
Vacuum ◽  
2013 ◽  
Vol 89 ◽  
pp. 220-224 ◽  
Author(s):  
Zhanyun Huang ◽  
Ping Luo ◽  
Wanzong Chen ◽  
Shirong Pan ◽  
Dihu Chen

1995 ◽  
Vol 76-77 ◽  
pp. 181-189 ◽  
Author(s):  
L. Kaplan ◽  
V.N. Zhitomirsky ◽  
S. Goldsmith ◽  
R.L. Boxman ◽  
I. Rusman

2008 ◽  
Vol 79 (6) ◽  
pp. 065104 ◽  
Author(s):  
Hua Dai ◽  
Yao Shen ◽  
Jing Wang ◽  
Ming Xu ◽  
Liuhe Li ◽  
...  

1993 ◽  
Vol 74 (6) ◽  
pp. 4239-4241 ◽  
Author(s):  
Simone Anders ◽  
André Anders ◽  
Ian Brown

Vacuum ◽  
2000 ◽  
Vol 59 (1) ◽  
pp. 159-167 ◽  
Author(s):  
R. Miyano ◽  
K. Kimura ◽  
K. Izumi ◽  
H. Takikawa ◽  
T. Sakakibara

2010 ◽  
Vol 160-162 ◽  
pp. 194-199 ◽  
Author(s):  
Chang Ji Hu ◽  
Zhen Hui He

ZnO thin films were deposited on polyimide foil substrates using cathodic vacuum arc deposition technique. X-ray diffraction was used to investigate the influence of bias voltage on the structure of ZnO thin films. The results show that all the samples have (002) preferred orientation. The internal stress of the films is compressive stress which increases with the bias voltage. Fragmentation test shows that the intrinsic interfacial shear strength of ZnO thin film without bias voltage is slightly lower than the shear yield strength of polyimide substrate; the intrinsic interfacial shear strength of ZnO thin film increases with the bias voltage from -50V to -200V, which indicates that bias voltage is beneficial to the enhancement of the adhesion between ZnO films and polyimide substrates. Further increase of the bias voltage to -300V leads to surface damage of the polyimide substrates.


Sign in / Sign up

Export Citation Format

Share Document