On the possibility of direct determination of the scattering phase in X-ray diffraction far from the reciprocal lattice points

1992 ◽  
Vol 163 (5-6) ◽  
pp. 447-449 ◽  
Author(s):  
V.A. Chaplanov
Author(s):  
P. L. La Fleur

AbstractThe dispersion of the thermal plane waves (phonons) in crystals can be determined from the x-ray diffraction intensity distribution around a reciprocal lattice point. In the method presented here no higher-order phonon-scattering corrections are necessary. It is shown furthermore that polarizations and dispersion of the phonons can be determined from the intensity distributions around six properly chosen reciprocal lattice points.


1968 ◽  
Vol 12 ◽  
pp. 354-371

AbstractA procedure for extracting the interference distribution from the X-ray diffraction line using measured instrumental and wavelength distributions has been applied to the study of residual stress in copper following extension.In the direct unfolding method the principal instrumental distributions due to the source and to specimen absorption are unfolded by the Fourier method. The remaining instrumental aberrations are extracted using the centroid displacements. The resultant scattering distribution is transformed by the relations of Mitchell and de Wolff and the spectral distribution unfolded. Conditions limiting the Fourier coefficients are applied to preserve stability. Measurements have been carried out with a diffractometer equipped with a diffracted beam monochromator.The 420 and 331 interference distributions in copper following 10% extension have been compared with those of stress - free material. The distributions are symmetric both in the annealed specimen and after extension. In extension the distributions are displaced by an amount equivalent to a surface compressive stress of 6 kg/mm2, The symmetry of the interference distributions indicates that the displacement is due to a macrostress distribution.


1987 ◽  
Vol 26 (Part 1, No. 1) ◽  
pp. 157-161 ◽  
Author(s):  
Osamu Nittono ◽  
Yoshihiro Sadamoto ◽  
Sheng Kai Gong

2008 ◽  
Vol 41 (3) ◽  
pp. 600-605 ◽  
Author(s):  
Jeffrey J. Lovelace ◽  
Cameron R. Murphy ◽  
Lee Daniels ◽  
Kartik Narayan ◽  
Clarence E. Schutt ◽  
...  

For a normal periodic crystal, the X-ray diffraction pattern can be described by an orientation matrix and a set of three integers that indicate the reciprocal lattice points. Those integers determine the spacing along the reciprocal lattice directions. In aperiodic crystals, the diffraction pattern is modulated and the standard periodic main reflections are surrounded by satellite reflections. The successful indexing and refinement of the main unit cell andqvector usingTWINSOLVE, developed by Svensson [(2003). Lund University, Sweden], are reported here for an incommensurately modulated, aperiodic crystal of a profilin:actin complex. The indexing showed that the modulation is along thebdirection in the crystal, which corresponds to an `actin ribbon' formed by the crystal lattice. Interestingly, the transition to the aperiodic state was shown to be reversible and the diffraction pattern returned to the periodic state during data collection. It is likely that the protein underwent a conformational change that affected the neighbouring profilin:actin molecules in such a way as to produce the observed modulation in the diffraction pattern. Future work will aim to trap the incommensurately modulated crystal state, for example using cryocooling or chemical crosslinking, thus allowing complete X-ray data to be collected.


2004 ◽  
Vol 36 (1-3) ◽  
pp. 11-19 ◽  
Author(s):  
M. Sztucki ◽  
T.U. Schülli ◽  
T.H. Metzger ◽  
E. Beham ◽  
D. Schuh ◽  
...  

1996 ◽  
Vol 449 ◽  
Author(s):  
A. Saxler ◽  
M. A. Capano ◽  
W. C. Mitchel ◽  
P. Kung ◽  
X. Zhang ◽  
...  

ABSTRACTX-ray rocking curves are frequently used to assess the structural quality of GaN thin films. In order to understand the information given by the line shape, we need to know the primary mechanism by which the curves are broadened. The GaN films used in this study were grown by low pressure metalorganic chemical vapor deposition (MOCVD) on (00•1) sapphire substrates. GaN films with both broad and very narrow (open detector linewidth of 40 arcseconds for the (00•2) GaN reflection) rocking curves are examined in this work. Reciprocal space maps of both symmetric and asymmetric reciprocal lattice points are used to determine that the cause of the broadening of GaN rocking curves is a limited in-plane coherence length.


2004 ◽  
Vol 19 (2) ◽  
pp. 195-195
Author(s):  
A. Broadhurst ◽  
K. D. Rogers ◽  
D. W. Lane ◽  
T. W. Lowe

2005 ◽  
Vol 20 (3) ◽  
pp. 233-240
Author(s):  
A. Broadhurst ◽  
K. D. Rogers ◽  
D. W. Lane ◽  
T. W. Lowe

A direct method for determining powder diffraction data from a range of depths is described, where the linear absorption coefficient may vary with depth. A series of traditional data collections with varying angles of incidence are required, and the X-ray diffraction data arising from specific depths will be calculated by the transformation of these measured, angle-dependent spectra. These may then be analysed using any conventional method in order to gain information about characteristics of the sample in question at specific depths. Regularisation techniques have been used to solve the governing Fredholm integral equation to determine the depth-dependent diffractograms. The method has been validated by the use of simulated data having known model profiles, and has also been applied to experimental data from polycrystalline thin film samples.


1999 ◽  
Vol 14 (5) ◽  
pp. 1744-1751 ◽  
Author(s):  
A. Vigliante ◽  
H. Homma ◽  
J. T. Zborowski ◽  
T. D. Golding ◽  
S. C. Moss

An In0.25Ga0.75Sb/InAs strained-layer superlattice, grown by molecular-beam epitaxy (MBE) on a GaSb[001] substrate, has been characterized by four-circle x-ray diffractometry. This system, proposed by Maliot and Smith for ir detection application, is challenging because of the two group V species and the likelihood of cross-incorporation of the different elements during growth, leading possibly to interdiffusion and thus, to a more diffuse interface. High-resolution x-ray diffraction (XRD) profiles were obtained about several reciprocal lattice points in order to extract a reliable set of structural parameters. The profiles were then successfully modeled by computer simulation. The presence of many sharp higher-order satellite reflections in the XRD profiles is a measure of the high quality of the superlattices. The normal and lateral structural coherence was also measured and will be discussed.


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