Characterization of polymeric thin films by low-damage secondary ion mass spectrometry

Applications of Surface Science ◽

10.1016/0378-5963(81)90127-6 ◽

1981 ◽

Vol 8 (3) ◽

pp. 337-342 ◽

Author(s):

J.E. Campana ◽

J.J. DeCorpo ◽

R.J. Colton

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Polymeric Thin Films ◽

Ion Mass Spectrometry ◽

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Characterization of Cu(InGa)Se2 (CIGS) Thin Films in Solar Cell Devices by Secondary Ion Mass Spectrometry

Journal of Surface Analysis ◽

10.1384/jsa.17.324 ◽

2011 ◽

Vol 17 (3) ◽

pp. 324-327 ◽

Author(s):

Weon Cheol Lim ◽

Jihye Lee ◽

Yeonhee Lee

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Ion Mass Spectrometry ◽

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Secondary ion mass spectrometry characterization of IrO2-Ta2O5 thin films: effect of relative composition on electrode properties

Rapid Communications in Mass Spectrometry ◽

10.1002/(sici)1097-0231(19981030)12:20<1574::aid-rcm352>3.0.co;2-p ◽

1998 ◽

Vol 12 (20) ◽

pp. 1574-1579 ◽

Author(s):

S. Daolio ◽

A. De Battisti ◽

M. Fabrizio ◽

L. Nanni ◽

C. Piccirillo

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Relative Composition ◽

Ion Mass Spectrometry ◽

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Characterization of carbon and carbon nitride thin films using time-of-flight secondary-ion-mass spectrometry

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.580533 ◽

1997 ◽

Vol 15 (4) ◽

pp. 2196-2201 ◽

Author(s):

L. J. Huang ◽

Y. Hung ◽

S. Chang ◽

G. R. Massoumi ◽

W. N. Lennard ◽

...

Keyword(s):

Mass Spectrometry ◽

Carbon Nitride ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Ion Mass Spectrometry ◽

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Abstract: Characterization of multilayer thin films using secondary ion mass spectrometry and improvement of the analytical techniques

Journal of Vacuum Science and Technology ◽

10.1116/1.568802 ◽

1975 ◽

Vol 12 (1) ◽

pp. 404-404 ◽

Author(s):

R. K. Lewis

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Analytical Techniques ◽

Multilayer Thin Films ◽

Abstract Characterization ◽

Ion Mass Spectrometry ◽

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Characterization of nitrided SiO2 thin films using secondary ion mass spectrometry

Applied Surface Science ◽

10.1016/s0169-4332(96)00175-4 ◽

1996 ◽

Vol 104-105 ◽

pp. 379-384 ◽

Author(s):

M.R. Frost ◽

C.W. Magee

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Ion Mass Spectrometry ◽

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Detection of Au+ Ions During Fluorine Gas-Assisted Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for the Complete Elemental Characterization of Microbatteries

ACS Applied Materials & Interfaces ◽

10.1021/acsami.1c10352 ◽

2021 ◽

Vol 13 (34) ◽

pp. 41262-41274

Author(s):

Agnieszka Priebe ◽

Jordi Sastre ◽

Moritz H. Futscher ◽

Jakub Jurczyk ◽

Marcos V. Puydinger dos Santos ◽

...

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Secondary Ion ◽

Elemental Characterization

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Tracer Diffusion Coefficients of Li Ions in LixMn2O4 Thin Films Observed by Isotope Exchange Secondary Ion Mass Spectrometry

The Journal of Physical Chemistry C ◽

10.1021/acs.jpcc.0c06375 ◽

2020 ◽

Vol 124 (42) ◽

pp. 22981-22992

Author(s):

Naoaki Kuwata ◽

Gen Hasegawa ◽

Daiki Maeda ◽

Norikazu Ishigaki ◽

Takamichi Miyazaki ◽

...

Keyword(s):

Mass Spectrometry ◽

Diffusion Coefficients ◽

Isotope Exchange ◽

Secondary Ion Mass Spectrometry ◽

Tracer Diffusion ◽

Ion Mass Spectrometry ◽

Tracer Diffusion Coefficients ◽

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Static secondary ion mass spectrometry analysis of UV photopolymerization in diacetylene thin films

Langmuir ◽

10.1021/la00059a010 ◽

1991 ◽

Vol 7 (11) ◽

pp. 2454-2459 ◽

Author(s):

Paula A. Cornelio-Clark ◽

Joseph A. Gardella

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Mass Spectrometry Analysis ◽

Spectrometry Analysis ◽

Ion Mass Spectrometry ◽

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Determination of concentration in depth profiles of thin films with Secondary Ion Mass Spectrometry

Vacuum ◽

10.1016/s0042-207x(76)81117-7 ◽

1976 ◽

Vol 26 (3) ◽

pp. 130

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Depth Profiles ◽

Ion Mass Spectrometry ◽

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Forensic Characterization of Lipsticks Using Time-of-Flight Secondary Ion Mass Spectrometry

Journal of Analytical Chemistry ◽

10.1134/s1061934821070091 ◽

2021 ◽

Vol 76 (7) ◽

pp. 854-867

Author(s):

Jihye Lee ◽

Yeonhee Lee

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Ion Mass Spectrometry ◽

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