Critical current density and pinning energy of an epitaxial YBa2Cu3O7−δ-film

1989 ◽  
Vol 161 (3) ◽  
pp. 444-446 ◽  
Author(s):  
G.M. Stollman ◽  
B. Dam ◽  
J.H.P.M. Emmen ◽  
J. Pankert
Keyword(s):  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Pinning Energy

Enhancement of Pinning Energy and Critical Current Density in Tl2CaBa2Cu2O8 Films by Proton Irradiation

1991 ◽  
Vol 235 ◽  
Author(s):  
M. E. Reeves ◽  
B. D. Weaver ◽  
G. P. Summers ◽  
R. J. Soulen ◽  
W. L. Olson ◽  
...  
Keyword(s):  
Thin Films ◽  
Radiation Dose ◽  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Defect Structure ◽  
Proton Irradiation ◽  
Irreversibility Line ◽  
Pinning Energy

ABSTRACTMeasurements are presented which show the effect of proton irradiation on the irreversibility line and critical current in Tl2 CaBa2Cu2O8 thin films. These data show that the irreversibility line is dependent on the defect structure and that the pinning energy is increased by proton irradiation. This leads to an increase in the critical current density at 60 K for the lowest radiation dose. Further irradiation reduces the critical current, even while the irreversibility line is enhanced.

Critical Current Density and Pinning Energy of Partial Melted Sm-Based Superconductor

2014 ◽  
Vol 95 ◽  
pp. 169-174
Author(s):  
Hiroya Imao
Keyword(s):  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Melting Process ◽  
Pinning Force ◽  
Pinning Energy ◽  
Partial Melting Process ◽  
Pinning Center ◽  
The Relationship ◽  
Critical Current Density Jc

The relationship between critical current density (Jc) and pinning energy (Up) in partial melted superconductors was investigated. The partial melted Sm-Ba-Cu-O superconducting bulks were composed of SmBa2Cu3Ox (Sm-123) superconductor and Sm2BaCuOy (Sm-211) insulator. The pinning force and the pinning energy of the superconductor were measured by a system combining an electronic balance and permanent magnet. The pinning energy and the Jc of the samples were influenced by crystalline orientation. The Jc of the samples depends on the pinning energy. However, in the partial melting process, changes in retention temperature altered the Jc values but had little effect on the value of the pinning energy. The results indicated that Jc was influenced by the dispersion of the insulator acting as a pinning center with in the superconducting bulks.

Critical current density and pinning energy of an epitaxial YBa2Cu3O7-δ-film

1989 ◽  
Vol 159 (6) ◽  
pp. 854-862 ◽  
Author(s):  
G.M. Stollman ◽  
B. Dam ◽  
J.H.P.M. Emmen ◽  
J. Pankert
Keyword(s):  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Pinning Energy

Critical current density and pinning energy in Ag-clad BPSCCO tapes

1996 ◽  
Vol 216 (3-4) ◽  
pp. 255-257 ◽  
Author(s):  
S.X. Dou ◽  
H.K. Liu ◽  
M. Ionescu ◽  
W.G. Wang ◽  
E. Babic ◽  
...  
Keyword(s):  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Pinning Energy

Microstructural characterization of YBa2Cu3O7-x thin films formed by metalorganic CVD

1991 ◽  
Vol 49 ◽  
pp. 1080-1081
Author(s):  
P. Lu ◽  
W. Huang ◽  
C.S. Chern ◽  
Y.Q. Li ◽  
J. Zhao ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Film Growth ◽  
Chemical Vapor ◽  
Microstructural Characterization ◽  
Ion Milling ◽  
Conventional Grinding

The YBa2Cu3O7-x thin films formed by metalorganic chemical vapor deposition(MOCVD) have been reported to have excellent superconducting properties including a sharp zero resistance transition temperature (Tc) of 89 K and a high critical current density of 2.3x106 A/cm2 or higher. The origin of the high critical current in the thin film compared to bulk materials is attributed to its structural properties such as orientation, grain boundaries and defects on the scale of the coherent length. In this report, we present microstructural aspects of the thin films deposited on the (100) LaAlO3 substrate, which process the highest critical current density.Details of the thin film growth process have been reported elsewhere. The thin films were examined in both planar and cross-section view by electron microscopy. TEM sample preparation was carried out using conventional grinding, dimpling and ion milling techniques. Special care was taken to avoid exposure of the thin films to water during the preparation processes.

Facet Topography and Dislocation Structure as a Possible Source for Electrical Heterogeneity in [001] TILT Bicrystals of YBa2Cu3O7-δ

1996 ◽  
Vol 54 ◽  
pp. 338-339
Author(s):  
I-Fei Tsu ◽  
D.L. Kaiser ◽  
S.E. Babcock
Keyword(s):  
Grain Boundary ◽  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Electromagnetic Properties ◽  
Length Scale ◽  
Density Values ◽  
Current Densities ◽  
Applied Fields ◽  
A Current

A current theme in the study of the critical current density behavior of YBa2Cu3O7-δ (YBCO) grain boundaries is that their electromagnetic properties are heterogeneous on various length scales ranging from 10s of microns to ˜ 1 Å. Recently, combined electromagnetic and TEM studies on four flux-grown bicrystals have demonstrated a direct correlation between the length scale of the boundaries’ saw-tooth facet configurations and the apparent length scale of the electrical heterogeneity. In that work, enhanced critical current densities are observed at applied fields where the facet period is commensurate with the spacing of the Abrikosov flux vortices which must be pinned if higher critical current density values are recorded. To understand the microstructural origin of the flux pinning, the grain boundary topography and grain boundary dislocation (GBD) network structure of [001] tilt YBCO bicrystals were studied by TEM and HRTEM.

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