Thin film strain gauges on polymers: main characteristics

1995 ◽  
Vol 46 (1-3) ◽  
pp. 213-217 ◽  
Author(s):  
H. Grange ◽  
C. Maeder ◽  
C. Bieth ◽  
S. Renard ◽  
G. Delapierre
Keyword(s):  
Vacuum ◽  
1984 ◽  
Vol 34 (1-2) ◽  
pp. 321-325 ◽  
Author(s):  
AG Taylor ◽  
RE Thurstans ◽  
DP Oxley

2015 ◽  
Vol 26 ◽  
pp. 355-358 ◽  
Author(s):  
Ju-Hyung Kim ◽  
Yuchen Liang ◽  
Soonmin Seo
Keyword(s):  

Author(s):  
Jih-Fen Lei ◽  
Lisa C. Martin ◽  
Herbert A. Will

Advanced thin film sensor techniques that can provide accurate surface strain and temperature measurements are being developed at NASA Lewis Research Center. These sensors are needed to provide minimally intrusive characterization of advanced materials (such as ceramics and composites) and structures (such as components for Space Shuttle Main Engine, High Speed Civil Transport, Advanced Subsonic Transports and General Aviation Aircraft) in hostile, high-temperature environments, and for validation of design codes. This paper presents two advanced thin film sensor technologies: strain gauges and thermocouples. These sensors are sputter deposited directly onto the test articles and are only a few micrometers thick; the surface of the test article is not structurally altered and there is minimal disturbance of the gas flow over the surface. The strain gauges are palladium-13% chromium based and the thermocouples are platinum-13% rhodium vs. platinum. The fabrication techniques of these thin film sensors in a class 1000 cleanroom at the NASA Lewis Research Center are described. Their demonstration on a variety of engine materials, including superalloys, ceramics and advanced ceramic matrix composites, in several hostile, high-temperature test environments are discussed.


2021 ◽  
Vol 10 (1) ◽  
pp. 53-61
Author(s):  
Maximilian Mathis ◽  
Dennis Vollberg ◽  
Matthäus Langosch ◽  
Dirk Göttel ◽  
Angela Lellig ◽  
...  

Abstract. An important property of high-precision mechanical sensors such as force transducers or torque sensors is the so-called creep error. It is defined as the signal deviation over time at a constant load. Since this signal deviation results in a reduced accuracy of the sensor, it is beneficial to minimize the creep error. Many of these sensors consist of a metallic spring element and strain gauges. In order to realize a sensor with a creep error of almost zero, it is necessary to compensate for the creep behavior of the metallic spring element. This can be achieved by creep adjustment of the used strain gauges. Unlike standard metal foil strain gauges with a gauge factor of 2, a type of strain gauges based on sputter-deposited NiCr-carbon thin films on polymer substrates offers the advantage of an improved gauge factor of about 10. However, for this type of strain gauge, creep adjustment by customary methods is not possible. In order to remedy this disadvantage, a thorough creep analysis is carried out. Five major influences on the creep error of force transducers equipped with NiCr-carbon thin-film strain gauges are examined, namely, the material creep of the metallic spring element (1), the creep (relaxation) of the polymer substrate (2), the composition of the thin film (3), the strain transfer to the thin film (4), and the kind of strain field on the surface of the transducer (5). Consequently, we present two applicable methods for creep adjustment of NiCr-carbon thin- film strain gauges. The first method addresses the intrinsic creep behavior of the thin film by a modification of the film composition. With increasing Cr content (at the expense of Ni, the intrinsic negative creep error can be shifted towards zero. The second method is not based on the thin film itself but rather on a modification of the strain transfer from the polyimide carrier to the thin film. This is achieved by controlled cutting of well-defined deep trenches into the polymer substrate via a picosecond laser.


1996 ◽  
Vol 45 (1) ◽  
pp. 335-339 ◽  
Author(s):  
M.M. Nayak ◽  
K. Rajanna ◽  
N. Gunasekaran ◽  
A.E. Muthunayagam ◽  
S. Mohan ◽  
...  

2012 ◽  
Vol 2012 (CICMT) ◽  
pp. 000175-000180
Author(s):  
Bjoern Brandt ◽  
Marion Gemeinert ◽  
Ralf Koppert ◽  
Jochen Bolte ◽  
Torsten Rabe

Recent advances in the development of high gauge factor thin-films for strain gauges prompt the research on advanced substrate materials. A glass ceramic composite has been developed in consideration of a high coefficient of thermal expansion and a low modulus of elasticity for the application as support material for thin-film sensors. Constantan foil strain gauges were fabricated from this material by tape casting, pressure-assisted sintering and subsequent lamination of the metal foil on the planar ceramic substrates. The sensors were mounted on a strain gauge beam arrangement and load curves and creep behavior were evaluated. The accuracy of the assembled load cells correspond to accuracy class C6. That qualifies the load cells for the use in automatic packaging units and confirms the applicability of the LTCC substrates for fabrication of accurate strain gauges. To facilitate the deposition of thin film sensor structures onto the LTCC substrates, the pressure-assisted sintering technology has been refined. By the use of smooth setters instead of release tapes substrates with minimal surface roughness were fabricated. Metallic thin films deposited on these substrates exhibit low surface resistances comparable to thin films on commercial alumina thin-film substrates. The presented advances in material design and manufacturing technology are important to promote the development of high performance thin-film strain gauges.


1975 ◽  
Vol 22 (3) ◽  
pp. 102-108 ◽  
Author(s):  
E.J. Stolinski ◽  
Z.H. Meiksin
Keyword(s):  

2016 ◽  
Vol 693 ◽  
pp. 1074-1081
Author(s):  
Yun Ping Cheng ◽  
Wen Ge Wu ◽  
Xiao Jun Du ◽  
Chun Hua An

This paper investigated the fabrication and design of embedded Ni-chrome thin-film strain gauges as micro-sensors in tool holders to measure the cutting force in machining operations. A Ni-chrome thin film as piezoresistive material sensor device is embedded within a substrate structure through brazing bonding process, which consists of a Ti6Al4V substrate, a Nickel-chromium thin film sensor and an Alumina insulating layer. The thin-films were characterized by 3D Super Depth Digital Microscope, SEM/EDS, Stylus profiler, to study microstructure, material composition, thickness and sheet resistance respectively. The thin-film strain gauges are calibrated in a cantilever beam setup. Accordingly, in-process cutting force measurement systems are established. The results showed that the thin-film sensor had good linearity and more elaborate structure and superior properties.


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