Microstructural and surface property variations due to the amorphous region formed by thermal annealing in Al-doped ZnO thin films grown on n-Si (100) substrates
2010 ◽
Vol 256
(6)
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pp. 1920-1924
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2011 ◽
Vol 59
(4)
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pp. 2774-2777
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2013 ◽
Vol 52
(6R)
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pp. 065502
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2012 ◽
Vol 12
(3)
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pp. 834-840
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2011 ◽
Vol 258
(1)
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pp. 604-607
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2013 ◽
Vol 231
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pp. 176-179
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