Application of thin film mercury electrodes and solid amalgam electrodes in electrochemical analysis of the nucleic acids components: detection of the two-dimensional phase transients of adenosine

This review is devoted to applications of mercury electrodes in the electrochemical analysis of nucleic acids and in studies of DNA structure and interactions. At the mercury electrodes, nucleic acids yield faradaic signals due to redox processes involving adenine, cytosine and guanine residues, and tensammetric signals due to adsorption/desorption of polynucleotide chains at the electrode surface. Some of these signals are highly sensitive to DNA structure, providing information about conformation changes of the DNA double helix, formation of DNA strand breaks as well as covalent or non-covalent DNA interactions with small molecules (including genotoxic agents, drugs, etc.). Measurements at mercury electrodes allow for determination of small quantities of unmodified or electrochemically labeled nucleic acids. DNA-modified mercury electrodes have been used as biodetectors for DNA damaging agents or as detection electrodes in DNA hybridization assays. Mercury film and solid amalgam electrodes possess similar features in the nucleic acid analysis to mercury drop electrodes. On the contrary, intrinsic (label-free) DNA electrochemical responses at other (non-mercury) solid electrodes cannot provide information about small changes of the DNA structure. A review with 188 references.

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Two-dimensional BN-doped ZnO thin-film deposition by a thermionic vacuum arc system

Journal of Materials Science Materials in Electronics ◽

10.1007/s10854-020-03258-1 ◽

2020 ◽

Vol 31 (9) ◽

pp. 6948-6955

Author(s):

Mustafa Özgür ◽

Suat Pat ◽

Reza Mohammadigharehbagh ◽

Uğur Demirkol ◽

Nihan Akkurt ◽

...

Keyword(s):

Thin Film ◽

Thin Film Deposition ◽

Film Deposition ◽

Vacuum Arc ◽

Zno Thin Film ◽

Two Dimensional ◽

Doped Zno ◽

Thermionic Vacuum Arc

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Influence of ion beam parameters onto two-dimensional optical thin film thickness distributions deposited by ion beam sputtering

Thin Solid Films ◽

10.1016/j.tsf.2019.05.027 ◽

2019 ◽

Vol 682 ◽

pp. 109-120 ◽

Cited By ~ 2

Author(s):

Wjatscheslaw Sakiew ◽

Stefan Schrameyer ◽

Marco Jupé ◽

Philippe Schwerdtner ◽

Nick Erhart ◽

...

Keyword(s):

Thin Film ◽

Film Thickness ◽

Ion Beam ◽

Two Dimensional ◽

Ion Beam Sputtering ◽

Thin Film Thickness ◽

Optical Thin Film ◽

Beam Sputtering ◽

Beam Parameters

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Unique Thermoelectric Properties Induced by Intrinsic Nanostructuring in a Polycrystalline Thin‐Film Two‐Dimensional Metal–Organic Framework, Copper Benzenehexathiol

physica status solidi (a) ◽

10.1002/pssa.202070064 ◽

2020 ◽

Vol 217 (23) ◽

pp. 2070064

Author(s):

Ryuichi Tsuchikawa ◽

Neda Lotfizadeh ◽

Nabajit Lahiri ◽

Shuwan Liu ◽

Mackenzie Lach ◽

...

Keyword(s):

Thin Film ◽

Thermoelectric Properties ◽

Metal Organic Framework ◽

Two Dimensional ◽

Polycrystalline Thin Film ◽

Metal Organic ◽

Organic Framework

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Two dimensional model of eddy currents and saturation in thin film write heads

7th Joint MMM-Intermag Conference. Abstracts (Cat. No.98CH36275) ◽

10.1109/intmag.1998.742079 ◽

2005 ◽

Author(s):

A.F. Torabi ◽

M.L. Mallary

Keyword(s):

Thin Film ◽

Eddy Currents ◽

Two Dimensional ◽

Dimensional Model ◽

Write Heads ◽

Two Dimensional Model

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Two dimensional current simulation of amorphous silicon thin-film transistors with extracted density of states by C-V characteristics and mobility measurement

2012 International Conference on Enabling Science and Nanotechnology ◽

10.1109/escinano.2012.6149635 ◽

2012 ◽

Author(s):

Seunghyun Jang ◽

Jaehong Lee ◽

Jaeho Lee ◽

Hyungcheol Shin

Keyword(s):

Thin Film ◽

Amorphous Silicon ◽

Density Of States ◽

Thin Film Transistors ◽

Two Dimensional ◽

Silicon Thin Film ◽

Mobility Measurement

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The Elastic Moduli of Silver Thin Films Measured with a New Microtensile Tester

MRS Proceedings ◽

10.1557/proc-239-239 ◽

1991 ◽

Vol 239 ◽

Cited By ~ 1

Author(s):

J. Ruud ◽

D. Josell ◽

A. L. Greer ◽

F. Spaepen

Keyword(s):

Thin Film ◽

Thin Films ◽

Diffraction Grating ◽

Strain Measurement ◽

Elastic Moduli ◽

Two Dimensional ◽

Bulk Crystals ◽

Free Standing ◽

Tensile Direction ◽

Silver Thin Films

ABSTRACTA new design for a thin film microtensile tester is presented. The strain is measured directly on the free-standing thin film from the displacement of laser spots diffracted from a thin grating applied to its surface by photolithography. The diffraction grating is two-dimensional, allowing strain measurement both along and transverse to the tensile direction. In principle, both Young's modulus and Poisson's ratio of a thin film can be determined. Ag thin films with strong <111> texture were tested. The measured Young moduli agreed with those measured on bulk crystals, but the measured Poisson ratios were low, most likely due to slight transverse folding of the film that developed during the test.

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